Abstract
Magnetic tunnel junction (MTJ) structures were investigated by x-ray photoelectron spectroscopy. The Al layer was overoxidized and the samples were treated by rapid thermal annealing. It was found that the Mn atoms in the exchange-bias layer diffused into the magnetic layer, but did not reach the oxide barrier. Although slightly higher oxygen concentration was observed at the interface between the magnetic layer and the oxide barrier, strong evidence of the oxidized magnetic-layer interface was not found. Our result is consistent with the high tunneling magnetoresistance of MTJs at room temperature.
| Original language | English |
|---|---|
| Article number | 033906 |
| Journal | Journal of Applied Physics |
| Volume | 97 |
| Issue number | 3 |
| DOIs | |
| State | Published - 1 Feb 2005 |
Bibliographical note
Funding Information:This work was supported by Korea Research Foundation Grant No. KRF-2003-042-C00038.