When thermal control meets sensor noise: Analysis of noise-induced temperature error

Dohwan Kim, Kyung Joon Park, Yongsoon Eun, Sang H. Son, Chenyang Lu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Scopus citations

Abstract

Thermal control is critical for real-time systems as overheated processors can result in serious performance degradation or even system breakdown due to hardware throttling. The major challenges in thermal control for real-time systems are (i) the need to enforce both real-time and thermal constraints; (ii) uncertain system dynamics; and (iii) thermal sensor noise. Previous studies have resolved the first two, but the practical issue of sensor noise has not been properly addressed yet. In this paper, we introduce a novel thermal control algorithm that can appropriately handle thermal sensor noise. Our key observation is that even a small zero-mean sensor noise can induce a significant steady-state error between the target and the actual temperature of a processor. This steady-state error is contrary to our intuition that zero-mean sensor noise induces zero-mean fluctuations. We show that an intuitive attempt to resolve this unusual situation is not effective at all. By a rigorous approach, we analyze the underlying mechanism and quantify the noised-induced error in a closed form in terms of noise statistics and system parameters. Based on our analysis, we propose a simple and effective solution for eliminating the error and maintaining the desired processor temperature. Through extensive simulations, we show the advantages of our proposed algorithm, referred to as Thermal Control under Utilization Bound with Virtual Saturation (TCUB-VS).

Original languageEnglish
Title of host publicationProceedings - 21st IEEE Real Time and Embedded Technology and Applications Symposium, RTAS 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages98-107
Number of pages10
ISBN (Electronic)9781479986033
DOIs
StatePublished - 14 May 2015
Event21st IEEE Real Time and Embedded Technology and Applications Symposium, RTAS 2015 - Seattle, United States
Duration: 13 Apr 201516 Apr 2015

Publication series

NameProceedings of the IEEE Real-Time and Embedded Technology and Applications Symposium, RTAS
Volume2015-May
ISSN (Print)1545-3421

Conference

Conference21st IEEE Real Time and Embedded Technology and Applications Symposium, RTAS 2015
Country/TerritoryUnited States
CitySeattle
Period13/04/1516/04/15

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

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