Abstract
We report the experimental evidence of significant change of the valence band structure during crystallization of Ge2 Sb2 Te5 (GST). Amorphous GST, prepared by sputter deposition at room temperature (RT), transforms successively into face-centered-cubic (fcc) and a hexagonal-close-packed (hcp) structures at around 150 and 300 °C, respectively, during a stepwise temperature increase from RT to 350 °C. During temperature increase, ultraviolet photoemission spectra were in vacuo obtained using synchrotron radiation. The measurement of the amorphous and fcc GST shows that the difference between the maximum valence band edge and the Fermi level reduces by 0.35 eV during crystallization. For the fcc to hcp phase transformation, no band gap reduction was observed.
Original language | English |
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Article number | 251901 |
Journal | Applied Physics Letters |
Volume | 91 |
Issue number | 25 |
DOIs | |
State | Published - 2007 |
Bibliographical note
Funding Information:Part of this work is supported by KORP through the “Development of Advanced Materials Metrology” project through Korea Research Institute of Standards and Science. Pohang Accelerator Laboratory is supported by Ministry of Science and Technology.