Unraveling the Origin and Mechanism of Nanofilament Formation in Polycrystalline SrTiO3 Resistive Switching Memories

Deok Hwang Kwon, Shinbuhm Lee, Chan Soon Kang, Yong Seok Choi, Sung Jin Kang, Hae Lim Cho, Woonbae Sohn, Janghyun Jo, Seung Yong Lee, Kyu Hwan Oh, Tae Won Noh, Roger A. De Souza, Manfred Martin, Miyoung Kim

Research output: Contribution to journalArticlepeer-review

50 Scopus citations

Abstract

Three central themes in the study of the phenomenon of resistive switching are the nature of the conducting phase, why it forms, and how it forms. In this study, the answers to all three questions are provided by performing switching experiments in situ in a transmission electron microscope on thin films of the model system polycrystalline SrTiO3. On the basis of high-resolution transmission electron microscopy, electron-energy-loss spectroscopy and in situ current–voltage measurements, the conducting phase is identified to be SrTi11O20. This phase is only observed at specific grain boundaries, and a Ruddlesden–Popper phase, Sr3Ti2O7, is typically observed adjacent to the conducting phase. These results allow not only the proposal that filament formation in this system has a thermodynamic origin—it is driven by electrochemical polarization and the local oxygen activity in the film decreasing below a critical value—but also the deduction of a phase diagram for strongly reduced SrTiO3. Furthermore, why many conducting filaments are nucleated at one electrode but only one filament wins the race to the opposite electrode is also explained. The work thus provides detailed insights into the origin and mechanisms of filament generation and rupture.

Original languageEnglish
Article number1901322
JournalAdvanced Materials
Volume31
Issue number28
DOIs
StatePublished - 12 Jul 2019

Bibliographical note

Publisher Copyright:
© 2019 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

Keywords

  • memristors
  • nanofilaments
  • resistive switching
  • transmission electron microscopy (TEM)

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