Abstract
A bismuth cluster ion-beam-based time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been successfully used to image micropatterns of streptavidin and Chinese hamster ovary (CHO-k1) cells, as received and without any labeling. Three different analysis ion beams (Bi+, Bi3+, and Bi3 2+) were compared to obtain label-free TOF-SIMS chemical images of micropatterns of streptavidin, which were subsequently used for generating biotinylated cell patterns. Unlike using a Bi+ ion beam, using a Bi3+ or Bi3 2+ primary analysis ion beam yielded well-contrasted-TOF-SIMS images of streptavidin characteristic secondary ions. A principal component analysis of TOF-SIMS data was performed to generate a chemical image of the streptavidin itself. A chemical specific TOF-SIMS image analysis gave us a better understanding of the localization of cells at the outer boundaries of the streptavidin-patterned circles. Our work suggests that using cluster-ion analysis beams together with multivariate data analysis for TOF-SIMS chemical imaging would be an effectual method for producing label-free chemical images of micropatterns of biomolecules, including proteins and cells.
Original language | English |
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Article number | 105604JVA |
Pages (from-to) | 1203-1207 |
Number of pages | 5 |
Journal | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
Volume | 24 |
Issue number | 4 |
DOIs | |
State | Published - Jul 2006 |
Bibliographical note
Funding Information:This work was supported by the R&D Program of Fusion Strategies for Advanced Technologies.