Time-of-flight secondary ion mass spectrometry chemical imaging analysis of micropatterns of streptavidin and cells without labeling

Tae Geol Lee, Hyun Kyong Shon, Kyung Bok Lee, Jinmo Kim, Insung S. Choi, Dae Won Moon

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

A bismuth cluster ion-beam-based time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been successfully used to image micropatterns of streptavidin and Chinese hamster ovary (CHO-k1) cells, as received and without any labeling. Three different analysis ion beams (Bi+, Bi3+, and Bi3 2+) were compared to obtain label-free TOF-SIMS chemical images of micropatterns of streptavidin, which were subsequently used for generating biotinylated cell patterns. Unlike using a Bi+ ion beam, using a Bi3+ or Bi3 2+ primary analysis ion beam yielded well-contrasted-TOF-SIMS images of streptavidin characteristic secondary ions. A principal component analysis of TOF-SIMS data was performed to generate a chemical image of the streptavidin itself. A chemical specific TOF-SIMS image analysis gave us a better understanding of the localization of cells at the outer boundaries of the streptavidin-patterned circles. Our work suggests that using cluster-ion analysis beams together with multivariate data analysis for TOF-SIMS chemical imaging would be an effectual method for producing label-free chemical images of micropatterns of biomolecules, including proteins and cells.

Original languageEnglish
Article number105604JVA
Pages (from-to)1203-1207
Number of pages5
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume24
Issue number4
DOIs
StatePublished - Jul 2006

Bibliographical note

Funding Information:
This work was supported by the R&D Program of Fusion Strategies for Advanced Technologies.

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