Time-dependent current-voltage curves during the forming process in unipolar resistance switching

S. B. Lee; H. K. Yoo; S. H. Chang; L. G. Gao; B. S. Kang; M. J. Lee; C. J. Kim; T. W. Noh

doi:10.1063/1.3552676

Time-dependent current-voltage curves during the forming process in unipolar resistance switching

S. B. Lee, H. K. Yoo, S. H. Chang, L. G. Gao, B. S. Kang, M. J. Lee, C. J. Kim, T. W. Noh

Research output: Contribution to journal › Article › peer-review

23 Scopus citations

Abstract

We investigated the time-dependent current-voltage curves of the forming process in unipolar resistance switching. We applied triggered-voltage triangular-waveform (pulse-waveform) signals with varied sweep rate (amplitude) to Pt/ SrTiO_x /Pt capacitors. By investigating their temperature dependences, we found that the forming process was driven by two different mechanisms, depending on the sweep rate (amplitude): a purely electrical dielectric breakdown and a thermally assisted dielectric breakdown. For the latter process, we observed precursory changes in the current I (t) before the forming process. By fitting the time-dependent precursory changes with I (t) = I_o -A exp (-t/τ), we suggest that the thermally activated migration of oxygen vacancies/ions could help the thermally assisted dielectric breakdown.

Original language	English
Article number	053503
Journal	Applied Physics Letters
Volume	98
Issue number	5
DOIs	https://doi.org/10.1063/1.3552676
State	Published - 31 Jan 2011

Bibliographical note

Funding Information:
This research was supported by National Research Foundation of Korea grants funded by the Korean Ministry of Education, Science and Technology [Grant Nos. 2009-0080567, 2010-0020416, and (B.S.K.) 2010-0011608]. S.B.L. acknowledges support from the Seoam Fellowship.

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@article{34ef86c3538d4b21b0dc843cfa44a98c,

title = "Time-dependent current-voltage curves during the forming process in unipolar resistance switching",

abstract = "We investigated the time-dependent current-voltage curves of the forming process in unipolar resistance switching. We applied triggered-voltage triangular-waveform (pulse-waveform) signals with varied sweep rate (amplitude) to Pt/ SrTiOx /Pt capacitors. By investigating their temperature dependences, we found that the forming process was driven by two different mechanisms, depending on the sweep rate (amplitude): a purely electrical dielectric breakdown and a thermally assisted dielectric breakdown. For the latter process, we observed precursory changes in the current I (t) before the forming process. By fitting the time-dependent precursory changes with I (t) = Io -A exp (-t/τ), we suggest that the thermally activated migration of oxygen vacancies/ions could help the thermally assisted dielectric breakdown.",

author = "Lee, {S. B.} and Yoo, {H. K.} and Chang, {S. H.} and Gao, {L. G.} and Kang, {B. S.} and Lee, {M. J.} and Kim, {C. J.} and Noh, {T. W.}",

note = "Funding Information: This research was supported by National Research Foundation of Korea grants funded by the Korean Ministry of Education, Science and Technology [Grant Nos. 2009-0080567, 2010-0020416, and (B.S.K.) 2010-0011608]. S.B.L. acknowledges support from the Seoam Fellowship.",

year = "2011",

month = jan,

day = "31",

doi = "10.1063/1.3552676",

language = "English",

volume = "98",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "5",

}

TY - JOUR

T1 - Time-dependent current-voltage curves during the forming process in unipolar resistance switching

AU - Lee, S. B.

AU - Yoo, H. K.

AU - Chang, S. H.

AU - Gao, L. G.

AU - Kang, B. S.

AU - Lee, M. J.

AU - Kim, C. J.

AU - Noh, T. W.

N1 - Funding Information: This research was supported by National Research Foundation of Korea grants funded by the Korean Ministry of Education, Science and Technology [Grant Nos. 2009-0080567, 2010-0020416, and (B.S.K.) 2010-0011608]. S.B.L. acknowledges support from the Seoam Fellowship.

PY - 2011/1/31

Y1 - 2011/1/31

N2 - We investigated the time-dependent current-voltage curves of the forming process in unipolar resistance switching. We applied triggered-voltage triangular-waveform (pulse-waveform) signals with varied sweep rate (amplitude) to Pt/ SrTiOx /Pt capacitors. By investigating their temperature dependences, we found that the forming process was driven by two different mechanisms, depending on the sweep rate (amplitude): a purely electrical dielectric breakdown and a thermally assisted dielectric breakdown. For the latter process, we observed precursory changes in the current I (t) before the forming process. By fitting the time-dependent precursory changes with I (t) = Io -A exp (-t/τ), we suggest that the thermally activated migration of oxygen vacancies/ions could help the thermally assisted dielectric breakdown.

AB - We investigated the time-dependent current-voltage curves of the forming process in unipolar resistance switching. We applied triggered-voltage triangular-waveform (pulse-waveform) signals with varied sweep rate (amplitude) to Pt/ SrTiOx /Pt capacitors. By investigating their temperature dependences, we found that the forming process was driven by two different mechanisms, depending on the sweep rate (amplitude): a purely electrical dielectric breakdown and a thermally assisted dielectric breakdown. For the latter process, we observed precursory changes in the current I (t) before the forming process. By fitting the time-dependent precursory changes with I (t) = Io -A exp (-t/τ), we suggest that the thermally activated migration of oxygen vacancies/ions could help the thermally assisted dielectric breakdown.

UR - http://www.scopus.com/inward/record.url?scp=79951498299&partnerID=8YFLogxK

U2 - 10.1063/1.3552676

DO - 10.1063/1.3552676

M3 - Article

AN - SCOPUS:79951498299

SN - 0003-6951

VL - 98

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 5

M1 - 053503

ER -

Time-dependent current-voltage curves during the forming process in unipolar resistance switching

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