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Thickness dependence of exchange anisotropy in NiFe/IrMn bilayers studied by Planar Hall Effect
- N. T. Thanh
- , M. G. Chun
- , N. D. Ha
- , K. Y. Kim
- , C. O. Kim
- , C. G. Kim
Research output: Contribution to journal › Article › peer-review
9
Scopus
citations