Thermal stability of perpendicular exchange bias in [Pd/ferromagnet] N/FeMn films

H. W. Joo, J. Heo, H. C. Choi, M. S. Kim, S. D. Choi, C. Y. You, K. A. Lee, S. S. Lee, D. G. Hwang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The dependencies of the annealing temperature and the stack number N on perpendicular exchange-biasing(Hex) and coercivity(Hc) in [Pd/Co]N and [Pd/Co (or CoFe)]N/FeMn multilayers were investigated. The surface anisotropy was varied as a function of N with constant bulk anisotropy. It was found that Ha does not depend on the surface anisotropy, while Hc shows a strong dependence. Therefore, it is possible to tailor wide ranges of the Hc (300 - 600 Oe) without varying Hex(250 - 300 Oe) through the single control parameter stack number N. After annealing the Hc shows peak value at 350°C in [Pd/Co] multilayers without FeMn, but the peak temperature is down to 250°C for the exchange biased [Pd/F]N/FeMn samples.

Original languageEnglish
Title of host publication2006 IEEE Nanotechnology Materials and Devices Conference, NMDC
Pages386-387
Number of pages2
DOIs
StatePublished - 2006
Event2006 IEEE Nanotechnology Materials and Devices Conference, NMDC - Gyeongju, Korea, Republic of
Duration: 22 Oct 200625 Oct 2006

Publication series

Name2006 IEEE Nanotechnology Materials and Devices Conference, NMDC
Volume1

Conference

Conference2006 IEEE Nanotechnology Materials and Devices Conference, NMDC
Country/TerritoryKorea, Republic of
CityGyeongju
Period22/10/0625/10/06

Keywords

  • Coercivity
  • Exchange bias
  • Pd/Co multilayer
  • Perpendicular magnetic anisotropy
  • Temperature dependence

Fingerprint

Dive into the research topics of 'Thermal stability of perpendicular exchange bias in [Pd/ferromagnet] N/FeMn films'. Together they form a unique fingerprint.

Cite this