Abstract
MTJs consisting of Ta(5)/Cu(10)/Ta(5)/NiFe(2)/Cu(5)/IrMn(10)/CoFe(2.5)/Al- O/CoFe(2.5)/NiFe(t)/Ta(5), where t = 10, 30, 60 and 100 nm in as-deposited and annealed state were characterized by XRD measurements: in grazing incidence (GID scan-2θ) and θ-2θ geometry, by rocking curve (scan-ω) and pole figures. The improvement of [111] texture and increase of average crystallite size of IrMn3 and Ni80Fe20 layers after annealing in 300°C lead to enhancement of interfacial coupling as well interlayer coupling.
| Original language | English |
|---|---|
| Pages (from-to) | e1503-e1505 |
| Journal | Journal of Magnetism and Magnetic Materials |
| Volume | 272-276 |
| Issue number | SUPPL. 1 |
| DOIs | |
| State | Published - May 2004 |
Keywords
- Interfacial magnetic property
- Magnetic tunneling junction
- XRD