The influence of NiFe thickness of top-electrode on exchange coupling parameters of IrMn based MTJ

T. Stobiecki; C. G. Kim; C. O. Kim; Y. K. Hu; M. Czapkiewicz; J. Kanak; J. Wrona; M. Tsunoda; M. Takahashi

doi:10.1016/j.jmmm.2003.12.311

The influence of NiFe thickness of top-electrode on exchange coupling parameters of IrMn based MTJ

T. Stobiecki, C. G. Kim, C. O. Kim, Y. K. Hu, M. Czapkiewicz, J. Kanak, J. Wrona, M. Tsunoda, M. Takahashi

Department of Physics and Chemistry

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

MTJs consisting of Ta(5)/Cu(10)/Ta(5)/NiFe(2)/Cu(5)/IrMn(10)/CoFe(2.5)/Al- O/CoFe(2.5)/NiFe(t)/Ta(5), where t = 10, 30, 60 and 100 nm in as-deposited and annealed state were characterized by XRD measurements: in grazing incidence (GID scan-2θ) and θ-2θ geometry, by rocking curve (scan-ω) and pole figures. The improvement of [111] texture and increase of average crystallite size of IrMn₃ and Ni₈₀Fe₂₀ layers after annealing in 300°C lead to enhancement of interfacial coupling as well interlayer coupling.

Original language	English
Pages (from-to)	e1503-e1505
Journal	Journal of Magnetism and Magnetic Materials
Volume	272-276
Issue number	SUPPL. 1
DOIs	https://doi.org/10.1016/j.jmmm.2003.12.311
State	Published - May 2004

Keywords

Interfacial magnetic property
Magnetic tunneling junction
XRD

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10.1016/j.jmmm.2003.12.311

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@article{3c20878fc88f4ffda9646b2c70a0689c,

title = "The influence of NiFe thickness of top-electrode on exchange coupling parameters of IrMn based MTJ",

abstract = "MTJs consisting of Ta(5)/Cu(10)/Ta(5)/NiFe(2)/Cu(5)/IrMn(10)/CoFe(2.5)/Al- O/CoFe(2.5)/NiFe(t)/Ta(5), where t = 10, 30, 60 and 100 nm in as-deposited and annealed state were characterized by XRD measurements: in grazing incidence (GID scan-2θ) and θ-2θ geometry, by rocking curve (scan-ω) and pole figures. The improvement of [111] texture and increase of average crystallite size of IrMn3 and Ni80Fe20 layers after annealing in 300°C lead to enhancement of interfacial coupling as well interlayer coupling.",

keywords = "Interfacial magnetic property, Magnetic tunneling junction, XRD",

author = "T. Stobiecki and Kim, {C. G.} and Kim, {C. O.} and Hu, {Y. K.} and M. Czapkiewicz and J. Kanak and J. Wrona and M. Tsunoda and M. Takahashi",

year = "2004",

month = may,

doi = "10.1016/j.jmmm.2003.12.311",

language = "English",

volume = "272-276",

pages = "e1503--e1505",

journal = "Journal of Magnetism and Magnetic Materials",

issn = "0304-8853",

publisher = "Elsevier B.V.",

number = "SUPPL. 1",

}

TY - JOUR

T1 - The influence of NiFe thickness of top-electrode on exchange coupling parameters of IrMn based MTJ

AU - Stobiecki, T.

AU - Kim, C. G.

AU - Kim, C. O.

AU - Hu, Y. K.

AU - Czapkiewicz, M.

AU - Kanak, J.

AU - Wrona, J.

AU - Tsunoda, M.

AU - Takahashi, M.

PY - 2004/5

Y1 - 2004/5

N2 - MTJs consisting of Ta(5)/Cu(10)/Ta(5)/NiFe(2)/Cu(5)/IrMn(10)/CoFe(2.5)/Al- O/CoFe(2.5)/NiFe(t)/Ta(5), where t = 10, 30, 60 and 100 nm in as-deposited and annealed state were characterized by XRD measurements: in grazing incidence (GID scan-2θ) and θ-2θ geometry, by rocking curve (scan-ω) and pole figures. The improvement of [111] texture and increase of average crystallite size of IrMn3 and Ni80Fe20 layers after annealing in 300°C lead to enhancement of interfacial coupling as well interlayer coupling.

AB - MTJs consisting of Ta(5)/Cu(10)/Ta(5)/NiFe(2)/Cu(5)/IrMn(10)/CoFe(2.5)/Al- O/CoFe(2.5)/NiFe(t)/Ta(5), where t = 10, 30, 60 and 100 nm in as-deposited and annealed state were characterized by XRD measurements: in grazing incidence (GID scan-2θ) and θ-2θ geometry, by rocking curve (scan-ω) and pole figures. The improvement of [111] texture and increase of average crystallite size of IrMn3 and Ni80Fe20 layers after annealing in 300°C lead to enhancement of interfacial coupling as well interlayer coupling.

KW - Interfacial magnetic property

KW - Magnetic tunneling junction

KW - XRD

UR - http://www.scopus.com/inward/record.url?scp=11144224017&partnerID=8YFLogxK

U2 - 10.1016/j.jmmm.2003.12.311

DO - 10.1016/j.jmmm.2003.12.311

M3 - Article

AN - SCOPUS:11144224017

SN - 0304-8853

VL - 272-276

SP - e1503-e1505

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

IS - SUPPL. 1

ER -

The influence of NiFe thickness of top-electrode on exchange coupling parameters of IrMn based MTJ

Abstract

Keywords

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