Abstract
The off-diagonal magnetoimpedance in field-annealed CoFeSiB amorphous ribbons was measured using a pick-up coil wound around the sample. One side of a ribbon was etched in hydrofluoric acid solution during various times in order to change the thickness of the surface crystalline layer appearing after annealing. The asymmetric two-peak field dependence of the off-diagonal impedance was observed for all samples. The evolution of the off-diagonal magnetoimpedance with the change in the ribbon thickness is analyzed.
Original language | English |
---|---|
Pages (from-to) | e186-e188 |
Journal | Journal of Magnetism and Magnetic Materials |
Volume | 304 |
Issue number | 1 |
DOIs | |
State | Published - Sep 2006 |
Bibliographical note
Funding Information:This work was supported by the Korea Science and Engineering Foundation through ReCAMM and by the Korea Electrical Engineering and Science Research Institute. N.A. Buznikov acknowledges the Brain Pool Program.
Keywords
- Amorphous ribbons
- Bias field
- Magnetoimpedance
- Off-diagonal impedance