The effect of C 60 cluster ion beam bombardment in sputter depth profiling of organic-inorganic hybrid multiple thin films

Hyun Kyong Shon, Tae Geol Lee, Dahl Hyun Kim, Hee Jae Kang, Byoung Hoon Lee, Myung Mo Sung, Dae Won Moon

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

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