Abstract
We measure the GMI ratio in a weak-field-annealed amorphous sample as a function of the measuring temperature over room temperature and discuss the change of GMI ratio in terms of the change of domain wall motions and rotational magnetization. Amorphous samples of Co66Fe4B15Si15 were annealed at a temperature of 380°C for 8 h in air. The annealing field, 3 Oe, was applied in the direction of the sample axis direction using a Helmholtz coil. The absolute value of impedance Z was measured by an impedance analyzer. The measuring temperature changed from 300 K to 443 K.
| Original language | English |
|---|---|
| Title of host publication | INTERMAG Europe 2002 - IEEE International Magnetics Conference |
| Editors | J. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 0780373650, 9780780373655 |
| DOIs | |
| State | Published - 2002 |
| Event | 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands Duration: 28 Apr 2002 → 2 May 2002 |
Publication series
| Name | INTERMAG Europe 2002 - IEEE International Magnetics Conference |
|---|
Conference
| Conference | 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 |
|---|---|
| Country/Territory | Netherlands |
| City | Amsterdam |
| Period | 28/04/02 → 2/05/02 |
Bibliographical note
Publisher Copyright:©2002 IEEE.