Temperature effect on the giant magnetoimpedance in amorphous materials

Y. W. Rheem, C. G. Kim, C. O. Kim, G. W. Kim, S. S. Yoon

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We measure the GMI ratio in a weak-field-annealed amorphous sample as a function of the measuring temperature over room temperature and discuss the change of GMI ratio in terms of the change of domain wall motions and rotational magnetization. Amorphous samples of Co66Fe4B15Si15 were annealed at a temperature of 380°C for 8 h in air. The annealing field, 3 Oe, was applied in the direction of the sample axis direction using a Helmholtz coil. The absolute value of impedance Z was measured by an impedance analyzer. The measuring temperature changed from 300 K to 443 K.

Original languageEnglish
Title of host publicationINTERMAG Europe 2002 - IEEE International Magnetics Conference
EditorsJ. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)0780373650, 9780780373655
DOIs
StatePublished - 2002
Event2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands
Duration: 28 Apr 20022 May 2002

Publication series

NameINTERMAG Europe 2002 - IEEE International Magnetics Conference

Conference

Conference2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
Country/TerritoryNetherlands
CityAmsterdam
Period28/04/022/05/02

Bibliographical note

Publisher Copyright:
©2002 IEEE.

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