Suppressing background noise in STED optical nanoscopy

Sejoo Jeong, Jaeyong Kim, Jong Chan Lee

Research output: Contribution to journalReview articlepeer-review

4 Scopus citations

Abstract

Super-resolution microscopy or optical nanoscopy has enabled all-optical observation of nanoscopic objects with resolution beyond Abbe’s diffraction limit. STimulated Emission Depletion (STED) nanoscopy achieves diffraction-unlimited resolution by employing a de-excitation laser with a hollow core in addition to the conventional excitation laser in confocal microscopy. One of the strong unexpected adverse effects in resolution improvement in STED nanoscopy is a structured, systematic background noise, which deteriorates the desired super-resolved image. Suppressing background noise, therefore, has been an important challenge in STED nanoscopy. Here, we introduce the characteristics of the background noise in STED nanoscopy and review several recent approaches that tackle this problem. The methods will be examined in comparison to one another and the advantages and disadvantages of each method will be highlighted.

Original languageEnglish
Pages (from-to)401-407
Number of pages7
JournalJournal of the Korean Physical Society
Volume78
Issue number5
DOIs
StatePublished - Mar 2021

Bibliographical note

Publisher Copyright:
© 2021, The Korean Physical Society.

Keywords

  • Background noise
  • STED
  • Super-resolution microscopy

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