Structural and magnetic properties of amorphous and nanocrystalline CoFeSiB thin films

Jungbum Yoon; Seung Young Park; Younghun Jo; Myung Hwa Jung; Chun Yeol You; Taewan Kim; Jae Youn Hwang; Hae In Yim; Jang Roh Rhee; Byong Sun Chun; You Song Kim; Young Keun Kim

doi:10.1109/TNANO.2008.926334

Structural and magnetic properties of amorphous and nanocrystalline CoFeSiB thin films

Jungbum Yoon, Seung Young Park, Younghun Jo, Myung Hwa Jung, Chun Yeol You, Taewan Kim, Jae Youn Hwang, Hae In Yim, Jang Roh Rhee, Byong Sun Chun, You Song Kim, Young Keun Kim

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

This study examined the structural, magnetic, and transport properties of CoFeSiB films with various Co compositions. The main focus was on two samples, amorphous Co₇₄Fe₄Si₁₄B₈ and nanocrystalline Co₇₈Fe₂Si₁₂B₈ thin films. The results show that the amorphous film is a typical soft magnetic material, while the nanocrystalline film has a large saturation field. It is believed that in a nanocrystalline thin film, a large saturation field is caused by antiferromagnetic exchange at the boundary between the amorphous and nanocrystalline phases.

Original language	English
Pages (from-to)	409-411
Number of pages	3
Journal	IEEE Transactions on Nanotechnology
Volume	7
Issue number	4
DOIs	https://doi.org/10.1109/TNANO.2008.926334
State	Published - Jul 2008

Bibliographical note

Funding Information:
Manuscript received May 14, 2007; revised October 21, 2007 and March 4, 2008. This work was supported by the Sogang University Research Grant of 200810017.01. The review of this paper was arranged by Associate Editor D. Litvinov. J. Yoon is with the Quantum Material Research Team, Korea Basic Science Institute, Daejeon 305-333, Korea, and also with the Department of Physics, University of Inha, Incheon 402-751, Korea. S.-Y. Park and Y. Jo are with the Quantum Material Research Team, Korea Basic Science Institute, Daejeon 305-333, Korea. M.-H. Jung is with the Department of Physics, Sogang University, Seoul 121-742, Korea (e-mail: [email protected]). C.-Y. You is with the Department of Physics, University of Inha, Incheon 402-751, Korea. T. Kim is with the Department of Advanced Materials Engineering, University of Sejong, Seoul 143-747, Korea. J. Y. Hwang, H. I. Yim, and J. R. Rhee are with the Department of Physics, University of Sookmyung Women’s, Seoul 140-742, Korea. B. S. Chun, Y. S. Kim, and Y. K. Kim are with the Department of Materials Science and Engineering, University of Korea, Seoul 136-713, Korea. Digital Object Identifier 10.1109/TNANO.2008.926334

Keywords

Amorphous
Antiferromagnetic exchange coupling
Nanocrystalline CoFeSiB thin film

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10.1109/TNANO.2008.926334

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title = "Structural and magnetic properties of amorphous and nanocrystalline CoFeSiB thin films",

abstract = "This study examined the structural, magnetic, and transport properties of CoFeSiB films with various Co compositions. The main focus was on two samples, amorphous Co74Fe4Si14B8 and nanocrystalline Co78Fe2Si12B8 thin films. The results show that the amorphous film is a typical soft magnetic material, while the nanocrystalline film has a large saturation field. It is believed that in a nanocrystalline thin film, a large saturation field is caused by antiferromagnetic exchange at the boundary between the amorphous and nanocrystalline phases.",

keywords = "Amorphous, Antiferromagnetic exchange coupling, Nanocrystalline CoFeSiB thin film",

author = "Jungbum Yoon and Park, \{Seung Young\} and Younghun Jo and Jung, \{Myung Hwa\} and You, \{Chun Yeol\} and Taewan Kim and \{Youn Hwang\}, Jae and \{In Yim\}, Hae and \{Roh Rhee\}, Jang and \{Sun Chun\}, Byong and \{Song Kim\}, You and \{Keun Kim\}, Young",

note = "Funding Information: Manuscript received May 14, 2007; revised October 21, 2007 and March 4, 2008. This work was supported by the Sogang University Research Grant of 200810017.01. The review of this paper was arranged by Associate Editor D. Litvinov. J. Yoon is with the Quantum Material Research Team, Korea Basic Science Institute, Daejeon 305-333, Korea, and also with the Department of Physics, University of Inha, Incheon 402-751, Korea. S.-Y. Park and Y. Jo are with the Quantum Material Research Team, Korea Basic Science Institute, Daejeon 305-333, Korea. M.-H. Jung is with the Department of Physics, Sogang University, Seoul 121-742, Korea (e-mail: [email protected]). C.-Y. You is with the Department of Physics, University of Inha, Incheon 402-751, Korea. T. Kim is with the Department of Advanced Materials Engineering, University of Sejong, Seoul 143-747, Korea. J. Y. Hwang, H. I. Yim, and J. R. Rhee are with the Department of Physics, University of Sookmyung Women{\textquoteright}s, Seoul 140-742, Korea. B. S. Chun, Y. S. Kim, and Y. K. Kim are with the Department of Materials Science and Engineering, University of Korea, Seoul 136-713, Korea. Digital Object Identifier 10.1109/TNANO.2008.926334",

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AU - Yoon, Jungbum

AU - Park, Seung Young

AU - Jo, Younghun

AU - Jung, Myung Hwa

AU - You, Chun Yeol

AU - Kim, Taewan

AU - Youn Hwang, Jae

AU - In Yim, Hae

AU - Roh Rhee, Jang

AU - Sun Chun, Byong

AU - Song Kim, You

AU - Keun Kim, Young

N1 - Funding Information: Manuscript received May 14, 2007; revised October 21, 2007 and March 4, 2008. This work was supported by the Sogang University Research Grant of 200810017.01. The review of this paper was arranged by Associate Editor D. Litvinov. J. Yoon is with the Quantum Material Research Team, Korea Basic Science Institute, Daejeon 305-333, Korea, and also with the Department of Physics, University of Inha, Incheon 402-751, Korea. S.-Y. Park and Y. Jo are with the Quantum Material Research Team, Korea Basic Science Institute, Daejeon 305-333, Korea. M.-H. Jung is with the Department of Physics, Sogang University, Seoul 121-742, Korea (e-mail: [email protected]). C.-Y. You is with the Department of Physics, University of Inha, Incheon 402-751, Korea. T. Kim is with the Department of Advanced Materials Engineering, University of Sejong, Seoul 143-747, Korea. J. Y. Hwang, H. I. Yim, and J. R. Rhee are with the Department of Physics, University of Sookmyung Women’s, Seoul 140-742, Korea. B. S. Chun, Y. S. Kim, and Y. K. Kim are with the Department of Materials Science and Engineering, University of Korea, Seoul 136-713, Korea. Digital Object Identifier 10.1109/TNANO.2008.926334

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N2 - This study examined the structural, magnetic, and transport properties of CoFeSiB films with various Co compositions. The main focus was on two samples, amorphous Co74Fe4Si14B8 and nanocrystalline Co78Fe2Si12B8 thin films. The results show that the amorphous film is a typical soft magnetic material, while the nanocrystalline film has a large saturation field. It is believed that in a nanocrystalline thin film, a large saturation field is caused by antiferromagnetic exchange at the boundary between the amorphous and nanocrystalline phases.

AB - This study examined the structural, magnetic, and transport properties of CoFeSiB films with various Co compositions. The main focus was on two samples, amorphous Co74Fe4Si14B8 and nanocrystalline Co78Fe2Si12B8 thin films. The results show that the amorphous film is a typical soft magnetic material, while the nanocrystalline film has a large saturation field. It is believed that in a nanocrystalline thin film, a large saturation field is caused by antiferromagnetic exchange at the boundary between the amorphous and nanocrystalline phases.

KW - Amorphous

KW - Antiferromagnetic exchange coupling

KW - Nanocrystalline CoFeSiB thin film

UR - https://www.scopus.com/pages/publications/48849115523

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JO - IEEE Transactions on Nanotechnology

JF - IEEE Transactions on Nanotechnology

IS - 4

ER -

Structural and magnetic properties of amorphous and nanocrystalline CoFeSiB thin films

Abstract

Bibliographical note

Keywords

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