Stabilizing the forming process in unipolar resistance switching using an improved compliance current limiter

S. B. Lee; S. H. Chang; H. K. Yoo; B. S. Kang

doi:10.1088/0022-3727/43/48/485103

Stabilizing the forming process in unipolar resistance switching using an improved compliance current limiter

S. B. Lee, S. H. Chang, H. K. Yoo, B. S. Kang

Department of Physics and Chemistry

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

Abstract

The high reset current I_R in unipolar resistance switching is a major obstacle to practical applications in memory devices. In particular, the first I_R value after the forming process is so high that the capacitors sometimes do not exhibit reliable unipolar resistance switching. We find that the compliance current I_compis a critical parameter for reducing I_R values in polycrystalline Pt/NiO_w/Pt, Pt/SrTiO_x/Pt, Ti/SrTiO_x/Pt, Pt/TiO_y/Pt and Pt/FeO_z/Pt capacitors, which show unipolar resistance switching. We therefore introduce an improved, simple and easy-to-use I_comp limiter that stabilizes the forming process by drastically decreasing the current overflow so as to precisely control the I_comp and subsequent I _R values.

Original language	English
Article number	485103
Journal	Journal of Physics D: Applied Physics
Volume	43
Issue number	48
DOIs	https://doi.org/10.1088/0022-3727/43/48/485103
State	Published - 8 Dec 2010

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title = "Stabilizing the forming process in unipolar resistance switching using an improved compliance current limiter",

abstract = "The high reset current IR in unipolar resistance switching is a major obstacle to practical applications in memory devices. In particular, the first IR value after the forming process is so high that the capacitors sometimes do not exhibit reliable unipolar resistance switching. We find that the compliance current Icompis a critical parameter for reducing IR values in polycrystalline Pt/NiOw/Pt, Pt/SrTiOx/Pt, Ti/SrTiOx/Pt, Pt/TiOy/Pt and Pt/FeOz/Pt capacitors, which show unipolar resistance switching. We therefore introduce an improved, simple and easy-to-use Icomp limiter that stabilizes the forming process by drastically decreasing the current overflow so as to precisely control the Icomp and subsequent I R values.",

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AU - Lee, S. B.

AU - Chang, S. H.

AU - Yoo, H. K.

AU - Kang, B. S.

PY - 2010/12/8

Y1 - 2010/12/8

N2 - The high reset current IR in unipolar resistance switching is a major obstacle to practical applications in memory devices. In particular, the first IR value after the forming process is so high that the capacitors sometimes do not exhibit reliable unipolar resistance switching. We find that the compliance current Icompis a critical parameter for reducing IR values in polycrystalline Pt/NiOw/Pt, Pt/SrTiOx/Pt, Ti/SrTiOx/Pt, Pt/TiOy/Pt and Pt/FeOz/Pt capacitors, which show unipolar resistance switching. We therefore introduce an improved, simple and easy-to-use Icomp limiter that stabilizes the forming process by drastically decreasing the current overflow so as to precisely control the Icomp and subsequent I R values.

AB - The high reset current IR in unipolar resistance switching is a major obstacle to practical applications in memory devices. In particular, the first IR value after the forming process is so high that the capacitors sometimes do not exhibit reliable unipolar resistance switching. We find that the compliance current Icompis a critical parameter for reducing IR values in polycrystalline Pt/NiOw/Pt, Pt/SrTiOx/Pt, Ti/SrTiOx/Pt, Pt/TiOy/Pt and Pt/FeOz/Pt capacitors, which show unipolar resistance switching. We therefore introduce an improved, simple and easy-to-use Icomp limiter that stabilizes the forming process by drastically decreasing the current overflow so as to precisely control the Icomp and subsequent I R values.

UR - https://www.scopus.com/pages/publications/78650126789

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DO - 10.1088/0022-3727/43/48/485103

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SN - 0022-3727

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JO - Journal of Physics D: Applied Physics

JF - Journal of Physics D: Applied Physics

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ER -

Stabilizing the forming process in unipolar resistance switching using an improved compliance current limiter

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