SEMPA imaging for spintronics applications

J. Unguris; S. H. Chung; D. T. Pierce

doi:10.1063/1.2799420

SEMPA imaging for spintronics applications

J. Unguris
, S. H. Chung
, D. T. Pierce

Division of Nanotechnology

National Institute of Standards and Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

Scanning Electron Microscopy with Polarization Analysis (SEMPA) provides high resolution (10 nm) magnetization images simultaneously with, but independent of, the topography. Such information is very useful in studying spintronics devices as illustrated by three examples: 1) exchange coupling of magnetic layers, 2) spin-transfer switching in magnetic nanowires, and 3) the ferromagnetic metal-semiconductor interface.

Original language	English
Title of host publication	CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS
Subtitle of host publication	2007 International Conference on Frontiers of Characterization and Metrology
Pages	472-476
Number of pages	5
DOIs	https://doi.org/10.1063/1.2799420
State	Published - 2007
Event	CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology - Gaithersburg, MD, United States Duration: 27 Mar 2007 → 29 Mar 2007

Publication series

Name	AIP Conference Proceedings
Volume	931
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Conference

Conference	CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology
Country/Territory	United States
City	Gaithersburg, MD
Period	27/03/07 → 29/03/07

Keywords

Exchange coupling
Nanomagnetism
Spin polarization
Spin reorientation
Spin torque transfer
Spintronics

Access to Document

10.1063/1.2799420

Cite this

@inproceedings{7e263cd358c0444a8fd1d4827023da84,

title = "SEMPA imaging for spintronics applications",

abstract = "Scanning Electron Microscopy with Polarization Analysis (SEMPA) provides high resolution (10 nm) magnetization images simultaneously with, but independent of, the topography. Such information is very useful in studying spintronics devices as illustrated by three examples: 1) exchange coupling of magnetic layers, 2) spin-transfer switching in magnetic nanowires, and 3) the ferromagnetic metal-semiconductor interface.",

keywords = "Exchange coupling, Nanomagnetism, Spin polarization, Spin reorientation, Spin torque transfer, Spintronics",

author = "J. Unguris and Chung, \{S. H.\} and Pierce, \{D. T.\}",

year = "2007",

doi = "10.1063/1.2799420",

language = "English",

isbn = "0735404410",

series = "AIP Conference Proceedings",

pages = "472--476",

booktitle = "CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS",

note = "CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology ; Conference date: 27-03-2007 Through 29-03-2007",

}

Unguris, J, Chung, SH & Pierce, DT 2007, SEMPA imaging for spintronics applications. in CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology. AIP Conference Proceedings, vol. 931, pp. 472-476, CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology, Gaithersburg, MD, United States, 27/03/07. https://doi.org/10.1063/1.2799420

SEMPA imaging for spintronics applications. / Unguris, J.; Chung, S. H.; Pierce, D. T.
CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology. 2007. p. 472-476 (AIP Conference Proceedings; Vol. 931).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - SEMPA imaging for spintronics applications

AU - Unguris, J.

AU - Chung, S. H.

AU - Pierce, D. T.

PY - 2007

Y1 - 2007

N2 - Scanning Electron Microscopy with Polarization Analysis (SEMPA) provides high resolution (10 nm) magnetization images simultaneously with, but independent of, the topography. Such information is very useful in studying spintronics devices as illustrated by three examples: 1) exchange coupling of magnetic layers, 2) spin-transfer switching in magnetic nanowires, and 3) the ferromagnetic metal-semiconductor interface.

AB - Scanning Electron Microscopy with Polarization Analysis (SEMPA) provides high resolution (10 nm) magnetization images simultaneously with, but independent of, the topography. Such information is very useful in studying spintronics devices as illustrated by three examples: 1) exchange coupling of magnetic layers, 2) spin-transfer switching in magnetic nanowires, and 3) the ferromagnetic metal-semiconductor interface.

KW - Exchange coupling

KW - Nanomagnetism

KW - Spin polarization

KW - Spin reorientation

KW - Spin torque transfer

KW - Spintronics

UR - https://www.scopus.com/pages/publications/35348876836

U2 - 10.1063/1.2799420

DO - 10.1063/1.2799420

M3 - Conference contribution

AN - SCOPUS:35348876836

SN - 0735404410

SN - 9780735404410

T3 - AIP Conference Proceedings

SP - 472

EP - 476

BT - CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS

T2 - CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology

Y2 - 27 March 2007 through 29 March 2007

ER -

SEMPA imaging for spintronics applications

Abstract

Publication series

Conference

Keywords

Access to Document

Other files and links

Fingerprint

Cite this