Scaling behaviors of reset voltages and currents in unipolar resistance switching

S. B. Lee; S. C. Chae; S. H. Chang; J. S. Lee; S. Seo; B. Kahng; T. W. Noh

doi:10.1063/1.3036532

Scaling behaviors of reset voltages and currents in unipolar resistance switching

S. B. Lee, S. C. Chae, S. H. Chang, J. S. Lee, S. Seo, B. Kahng, T. W. Noh

Department of Physics and Chemistry

Research output: Contribution to journal › Article › peer-review

83 Scopus citations

Abstract

The wide distributions of switching voltages in unipolar switching currently pose major obstacles for scientific advancement and practical applications. Using NiO capacitors, we investigated the distributions of the reset voltage and current. We found that they scaled with the resistance value Ro in the low resistance state and that the scaling exponents varied at R _o ≈30 Ω. We explain these intriguing scaling behaviors and their crossovers by analogy with percolation theory. We show that the connectivity of conducting filaments plays a crucial role in the reset process.

Original language	English
Article number	212105
Journal	Applied Physics Letters
Volume	93
Issue number	21
DOIs	https://doi.org/10.1063/1.3036532
State	Published - 2008

Bibliographical note

Funding Information:
This work was supported by the Creative Research Initiatives (Functionally Integrated Oxide Heterostructure) of the Ministry of Science and Technology (MOST) and the Korean Science and Engineering Foundation (KOSEF). B.K. and J.S.L. were supported by the KOSEF grant funded by the MOST (Grant No.R17-2007-073-01001-0). S.B.L. acknowledges support from a Seoul Science Scholarship.

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@article{a63e5525a96249fcae6b24f52ce7d0a1,

title = "Scaling behaviors of reset voltages and currents in unipolar resistance switching",

abstract = "The wide distributions of switching voltages in unipolar switching currently pose major obstacles for scientific advancement and practical applications. Using NiO capacitors, we investigated the distributions of the reset voltage and current. We found that they scaled with the resistance value Ro in the low resistance state and that the scaling exponents varied at R o ≈30 Ω. We explain these intriguing scaling behaviors and their crossovers by analogy with percolation theory. We show that the connectivity of conducting filaments plays a crucial role in the reset process.",

author = "Lee, {S. B.} and Chae, {S. C.} and Chang, {S. H.} and Lee, {J. S.} and S. Seo and B. Kahng and Noh, {T. W.}",

note = "Funding Information: This work was supported by the Creative Research Initiatives (Functionally Integrated Oxide Heterostructure) of the Ministry of Science and Technology (MOST) and the Korean Science and Engineering Foundation (KOSEF). B.K. and J.S.L. were supported by the KOSEF grant funded by the MOST (Grant No.R17-2007-073-01001-0). S.B.L. acknowledges support from a Seoul Science Scholarship.",

year = "2008",

doi = "10.1063/1.3036532",

language = "English",

volume = "93",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "21",

}

TY - JOUR

T1 - Scaling behaviors of reset voltages and currents in unipolar resistance switching

AU - Lee, S. B.

AU - Chae, S. C.

AU - Chang, S. H.

AU - Lee, J. S.

AU - Seo, S.

AU - Kahng, B.

AU - Noh, T. W.

N1 - Funding Information: This work was supported by the Creative Research Initiatives (Functionally Integrated Oxide Heterostructure) of the Ministry of Science and Technology (MOST) and the Korean Science and Engineering Foundation (KOSEF). B.K. and J.S.L. were supported by the KOSEF grant funded by the MOST (Grant No.R17-2007-073-01001-0). S.B.L. acknowledges support from a Seoul Science Scholarship.

PY - 2008

Y1 - 2008

N2 - The wide distributions of switching voltages in unipolar switching currently pose major obstacles for scientific advancement and practical applications. Using NiO capacitors, we investigated the distributions of the reset voltage and current. We found that they scaled with the resistance value Ro in the low resistance state and that the scaling exponents varied at R o ≈30 Ω. We explain these intriguing scaling behaviors and their crossovers by analogy with percolation theory. We show that the connectivity of conducting filaments plays a crucial role in the reset process.

AB - The wide distributions of switching voltages in unipolar switching currently pose major obstacles for scientific advancement and practical applications. Using NiO capacitors, we investigated the distributions of the reset voltage and current. We found that they scaled with the resistance value Ro in the low resistance state and that the scaling exponents varied at R o ≈30 Ω. We explain these intriguing scaling behaviors and their crossovers by analogy with percolation theory. We show that the connectivity of conducting filaments plays a crucial role in the reset process.

UR - http://www.scopus.com/inward/record.url?scp=57049104587&partnerID=8YFLogxK

U2 - 10.1063/1.3036532

DO - 10.1063/1.3036532

M3 - Article

AN - SCOPUS:57049104587

SN - 0003-6951

VL - 93

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 21

M1 - 212105

ER -

Scaling behaviors of reset voltages and currents in unipolar resistance switching

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