Abstract
We find that resistance switching (RS) phenomena change reversibly between bipolar RS (BRS) and unipolar RS (URS) in a Pt/SrTiO x/Pt cell. For an asymmetric electrode configuration of Ti/SrTiO x/Pt cells whose top and bottom interfaces are Ohmic and Schottky-like rectifying, we determine that BRS only occurs when a positive voltage is applied to the bottom Pt electrode at the forming process. During the set process of BRS in a Pt/SrTiO x/Pt cell, O 2 bubbles develop on the top Pt electrode. From the experimental results for a single sample in which both BRS and URS occur, O 2- ion movement and consequent interfacial resistance modification might play an important role in BRS but not URS.
Original language | English |
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Pages (from-to) | 1515-1517 |
Number of pages | 3 |
Journal | Current Applied Physics |
Volume | 12 |
Issue number | 6 |
DOIs | |
State | Published - Nov 2012 |
Bibliographical note
Funding Information:This research was supported by National Research Foundation of Korea grants funded by the Korean Ministry of Education, Science and Technology (No. 2009-0080567 and No. 2010-0020416 ; B.S.K.: No. 2011-0004004 ). S.B.L. was supported by the National Research Foundation of Korea Grant funded by the Korean Government [ NRF-2011-354-C00031 ].
Keywords
- Memristor
- Resistance random-access memory
- Resistance switching