Resistive switching transition induced by a voltage pulse in a Pt/NiO/Pt structure

Inrok Hwang, Myung Jae Lee, Gyoung Ho Buh, Jieun Bae, Jinsik Choi, Jin Soo Kim, Sahwan Hong, Yeon Soo Kim, Ik Su Byun, Seung Woong Lee, Seung Eon Ahn, Bo Soo Kang, Sung Oong Kang, Bae Ho Park

Research output: Contribution to journalArticlepeer-review

69 Scopus citations

Abstract

We have observed a switching transition between bistable memory switching and monostable threshold switching in Pt/NiO/Pt structure. Bistable memory switching could be changed to monostable threshold switching by applying a positive electrical pulse with height of 2 V and width between 10-2 and 10-4 s. The change is reversible by applying a negative electrical pulse with the same height and width. By considering polarity- and width-dependence of the switching transition and compositional difference on electrical properties in NiOx, we have proposed a model in which the migration of oxygen ions (O2-) is responsible for the switching transition in Pt/NiO/Pt structures.

Original languageEnglish
Article number052106
JournalApplied Physics Letters
Volume97
Issue number5
DOIs
StatePublished - 2 Aug 2010

Bibliographical note

Funding Information:
This work was supported by the KOSEF NRL Program grant funded by the Korea Government MEST (Grant No. R0A-2008-000-20052-0), WCU program through the KOSEF funded by the MEST (Grant No. R31-2008-000-10057-0), Nano R&D program through the KOSEF by MEST (Grant No. 2008-02557), Seoul R&BD Program (Grant No. WR090671), and KOSEF grant funded by the Korea MEST (Quantum Metamaterials Research Center, Grant No. R11-2008-053-03002-0).

Fingerprint

Dive into the research topics of 'Resistive switching transition induced by a voltage pulse in a Pt/NiO/Pt structure'. Together they form a unique fingerprint.

Cite this