Abstract
We report studies of resistance switching characteristics of Pt/FeO x/Pt structures, of which FeOx thin films were formed by thermal oxidation of Fe layers. X-ray diffraction (XRD) studies showed that less oxidized Fe3O4 phase disappeared and α-Fe 3O4 phase was formed at annealing temperatures ≥400 °C. The electroforming process, usually occurring at 7 ∼ 10 V, increased the conductivity of the structure significantly(> 102) and brought about reversible resistance switching under unipolar bias voltage. We successfully demonstrated that the FeOx films exhibited reliable memory switching behaviors.
| Original language | English |
|---|---|
| Pages (from-to) | S96-S99 |
| Journal | Journal of the Korean Physical Society |
| Volume | 51 |
| Issue number | SUPPL. 2 |
| DOIs | |
| State | Published - Oct 2007 |
Keywords
- Electroforming
- Iron oxides
- Resistance switching
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