Reliability analysis of 4 in. field-emission display

  • J. M. Kim
  • , J. P. Hong
  • , J. W. Kim
  • , J. H. Choi
  • , N. S. Park
  • , J. H. Kang
  • , J. E. Jang
  • , Y. S. Ryu
  • , H. C. Yang
  • , B. I. Gorfinkel
  • , E. V. Roussina

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

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