Reliability analysis of 4 in. field-emission display

J. M. Kim; J. P. Hong; J. W. Kim; J. H. Choi; N. S. Park; J. H. Kang; J. E. Jang; Y. S. Ryu; H. C. Yang; B. I. Gorfinkel; E. V. Roussina

doi:10.1116/1.589286

Reliability analysis of 4 in. field-emission display

J. M. Kim, J. P. Hong, J. W. Kim, J. H. Choi, N. S. Park, J. H. Kang, J. E. Jang, Y. S. Ryu, H. C. Yang, B. I. Gorfinkel, E. V. Roussina

Department of Electrical Engineering and Computer Science

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

4 in. field-emission display (FED) devices have been constructed and analyzed utilizing Spindt-type cathodes, uniquely developed low-voltage phosphors and spacers. The cathode was especially fabricated without using a resistive layer. The reliability and the feasibility of the FED device have been tested both in a vacuum chamber and in a fully sealed condition. The electrical aging effect on microtip emission properties were carried out. which resulted in significant enhancement in electrical characteristics of the FED device. The fully sealed FED device was analyzed as a function of lifetime. Additionally, the characteristics of the phosphor and the spacer used in our FED device are discussed.

Original language	English
Pages (from-to)	528-532
Number of pages	5
Journal	Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume	15
Issue number	2
DOIs	https://doi.org/10.1116/1.589286
State	Published - 1997

Access to Document

10.1116/1.589286

Cite this

@article{f91e78e7f47149cb9f9a570bbdb6eb2c,

title = "Reliability analysis of 4 in. field-emission display",

abstract = "4 in. field-emission display (FED) devices have been constructed and analyzed utilizing Spindt-type cathodes, uniquely developed low-voltage phosphors and spacers. The cathode was especially fabricated without using a resistive layer. The reliability and the feasibility of the FED device have been tested both in a vacuum chamber and in a fully sealed condition. The electrical aging effect on microtip emission properties were carried out. which resulted in significant enhancement in electrical characteristics of the FED device. The fully sealed FED device was analyzed as a function of lifetime. Additionally, the characteristics of the phosphor and the spacer used in our FED device are discussed.",

author = "Kim, {J. M.} and Hong, {J. P.} and Kim, {J. W.} and Choi, {J. H.} and Park, {N. S.} and Kang, {J. H.} and Jang, {J. E.} and Ryu, {Y. S.} and Yang, {H. C.} and Gorfinkel, {B. I.} and Roussina, {E. V.}",

year = "1997",

doi = "10.1116/1.589286",

language = "English",

volume = "15",

pages = "528--532",

journal = "Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures",

issn = "1071-1023",

publisher = "AVS Science and Technology Society",

number = "2",

}

TY - JOUR

T1 - Reliability analysis of 4 in. field-emission display

AU - Kim, J. M.

AU - Hong, J. P.

AU - Kim, J. W.

AU - Choi, J. H.

AU - Park, N. S.

AU - Kang, J. H.

AU - Jang, J. E.

AU - Ryu, Y. S.

AU - Yang, H. C.

AU - Gorfinkel, B. I.

AU - Roussina, E. V.

PY - 1997

Y1 - 1997

N2 - 4 in. field-emission display (FED) devices have been constructed and analyzed utilizing Spindt-type cathodes, uniquely developed low-voltage phosphors and spacers. The cathode was especially fabricated without using a resistive layer. The reliability and the feasibility of the FED device have been tested both in a vacuum chamber and in a fully sealed condition. The electrical aging effect on microtip emission properties were carried out. which resulted in significant enhancement in electrical characteristics of the FED device. The fully sealed FED device was analyzed as a function of lifetime. Additionally, the characteristics of the phosphor and the spacer used in our FED device are discussed.

AB - 4 in. field-emission display (FED) devices have been constructed and analyzed utilizing Spindt-type cathodes, uniquely developed low-voltage phosphors and spacers. The cathode was especially fabricated without using a resistive layer. The reliability and the feasibility of the FED device have been tested both in a vacuum chamber and in a fully sealed condition. The electrical aging effect on microtip emission properties were carried out. which resulted in significant enhancement in electrical characteristics of the FED device. The fully sealed FED device was analyzed as a function of lifetime. Additionally, the characteristics of the phosphor and the spacer used in our FED device are discussed.

UR - http://www.scopus.com/inward/record.url?scp=0000511536&partnerID=8YFLogxK

U2 - 10.1116/1.589286

DO - 10.1116/1.589286

M3 - Article

AN - SCOPUS:0000511536

SN - 1071-1023

VL - 15

SP - 528

EP - 532

JO - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

JF - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

IS - 2

ER -

Reliability analysis of 4 in. field-emission display

Abstract

Access to Document

Other files and links

Fingerprint

Cite this