Abstract
We report on the characteristics of a ZnO light-emitting diode (LED) comprised of a heterostructure of p -ZnO/ n -GaN. The LED structure consisted of a phosphorus doped p -ZnO film with a hole concentration of 6.68×1017 cm-3 and a Si-doped n -GaN film with an electron concentration of 1.1×1018 cm-3. The I-V of the LED showed a threshold voltage of 5.4 V and an electroluminescence (EL) emission of 409 nm at room temperature. The EL emission peak at 409 nm was attributed to the band gap of p -ZnO which was reduced as the result of the band offset at the interface of p -ZnO and n -GaN.
Original language | English |
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Article number | 222101 |
Pages (from-to) | 1-3 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 86 |
Issue number | 22 |
DOIs | |
State | Published - 2005 |
Bibliographical note
Funding Information:This work was partially supported by the National Research Laboratory Program for Nanophotonic Semiconductors in Korea and the Air Force Office of Science Research (AOARD-04-4014) in the USA.