Multilevel unipolar resistance switching in TiO2 thin films

S. C. Chae; J. S. Lee; W. S. Choi; S. B. Lee; S. H. Chang; H. Shin; B. Kahng; T. W. Noh

doi:10.1063/1.3224185

Multilevel unipolar resistance switching in TiO₂ thin films

S. C. Chae
, J. S. Lee
, W. S. Choi
, S. B. Lee
, S. H. Chang
, H. Shin
, B. Kahng
, T. W. Noh

Department of Physics and Chemistry

Research output: Contribution to journal › Article › peer-review

34 Scopus citations

Abstract

We report on multilevel switching behavior in the unipolar resistance switching of TiO₂ thin films. Multiple metastable states were observed during the reset process by measuring I-V curves. As observed using a conducting atomic force microscope, the multilevel resistance switching was accompanied by decreases in area and in the conductance of the top surface conducting regions. These experimental observations at both the macroscopic and microscopic levels could be explained by using the "random circuit breaker network" model, which is a dynamic bond percolation model.

Original language	English
Article number	093508
Journal	Applied Physics Letters
Volume	95
Issue number	9
DOIs	https://doi.org/10.1063/1.3224185
State	Published - 2009

Bibliographical note

Funding Information:
This research was supported by the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (Grant No. 2009-0080567). B.K. and J.S.L. were supported by a KOSEF grant funded by MOST (Grant No. R17-2007-073-01001-0). H.S. and W.S.C. would like to thank the Center for Material and Processes of Self-assembly (Grant No. R11-2005-048-00000-0) and the National Research Laboratory (Grant No. R0A-2007-000-20105-0) in the MOST/KOSEF ERC program.

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title = "Multilevel unipolar resistance switching in TiO2 thin films",

abstract = "We report on multilevel switching behavior in the unipolar resistance switching of TiO2 thin films. Multiple metastable states were observed during the reset process by measuring I-V curves. As observed using a conducting atomic force microscope, the multilevel resistance switching was accompanied by decreases in area and in the conductance of the top surface conducting regions. These experimental observations at both the macroscopic and microscopic levels could be explained by using the {"}random circuit breaker network{"} model, which is a dynamic bond percolation model.",

author = "Chae, \{S. C.\} and Lee, \{J. S.\} and Choi, \{W. S.\} and Lee, \{S. B.\} and Chang, \{S. H.\} and H. Shin and B. Kahng and Noh, \{T. W.\}",

note = "Funding Information: This research was supported by the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (Grant No. 2009-0080567). B.K. and J.S.L. were supported by a KOSEF grant funded by MOST (Grant No. R17-2007-073-01001-0). H.S. and W.S.C. would like to thank the Center for Material and Processes of Self-assembly (Grant No. R11-2005-048-00000-0) and the National Research Laboratory (Grant No. R0A-2007-000-20105-0) in the MOST/KOSEF ERC program.",

year = "2009",

doi = "10.1063/1.3224185",

language = "English",

volume = "95",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "9",

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TY - JOUR

T1 - Multilevel unipolar resistance switching in TiO2 thin films

AU - Chae, S. C.

AU - Lee, J. S.

AU - Choi, W. S.

AU - Lee, S. B.

AU - Chang, S. H.

AU - Shin, H.

AU - Kahng, B.

AU - Noh, T. W.

N1 - Funding Information: This research was supported by the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (Grant No. 2009-0080567). B.K. and J.S.L. were supported by a KOSEF grant funded by MOST (Grant No. R17-2007-073-01001-0). H.S. and W.S.C. would like to thank the Center for Material and Processes of Self-assembly (Grant No. R11-2005-048-00000-0) and the National Research Laboratory (Grant No. R0A-2007-000-20105-0) in the MOST/KOSEF ERC program.

PY - 2009

Y1 - 2009

N2 - We report on multilevel switching behavior in the unipolar resistance switching of TiO2 thin films. Multiple metastable states were observed during the reset process by measuring I-V curves. As observed using a conducting atomic force microscope, the multilevel resistance switching was accompanied by decreases in area and in the conductance of the top surface conducting regions. These experimental observations at both the macroscopic and microscopic levels could be explained by using the "random circuit breaker network" model, which is a dynamic bond percolation model.

AB - We report on multilevel switching behavior in the unipolar resistance switching of TiO2 thin films. Multiple metastable states were observed during the reset process by measuring I-V curves. As observed using a conducting atomic force microscope, the multilevel resistance switching was accompanied by decreases in area and in the conductance of the top surface conducting regions. These experimental observations at both the macroscopic and microscopic levels could be explained by using the "random circuit breaker network" model, which is a dynamic bond percolation model.

UR - https://www.scopus.com/pages/publications/69949182756

U2 - 10.1063/1.3224185

DO - 10.1063/1.3224185

M3 - Article

AN - SCOPUS:69949182756

SN - 0003-6951

VL - 95

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 9

M1 - 093508

ER -

Multilevel unipolar resistance switching in TiO₂ thin films

Abstract

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