@inproceedings{4c3a2b65ba4e4571a5d2ebc8035c4bad,
title = "Microstructure and magnetic properties of CoFeHfO rich nanocrystalline thin films application for high frequency",
abstract = "Nanocrystalline CoFeHfO thin films have been fabricated by RF sputtering method. Co52Fe23Hf10O15 thin film is observed, exhibit good magnetic properties with magnetic coercivity (H c) of 0.18 Oe; anisotropy fild (Hk) of 49 Oe; saturation magnetization (4πMs) of 21 kG, and electrical resistivity (ρ) of 300 μΩcm. The frequency response of permeability of the film is excellent. The effect of microstructure on the electrical and magnetic properties of thin film was studied using X-ray diffraction (XRD) analysis and conventional transmission electron microscopy (TEM). The results showed that excellent soft magnetic properties were associated with granular nannoscale grains of α-CoFe and α-Co(Fe) phases.",
keywords = "Magnetic properties, Microstructure, Nanocrystalline",
author = "Tho, {L. V.} and Lee, {K. E.} and Kim, {C. G.} and Kim, {C. O.} and Cho, {W. S.}",
year = "2007",
doi = "10.4028/0-87849-443-x.975",
language = "English",
isbn = "087849443X",
series = "Materials Science Forum",
publisher = "Trans Tech Publications Ltd",
number = "PART 2",
pages = "975--978",
booktitle = "Recrystallization and Grain Growth III - Proceedings of the Third International Conference on Recrystallization and Grain Growth, ReX and GG III",
edition = "PART 2",
note = "3rd International Conference on Recrystallization and Grain Growth, ReX GG III ; Conference date: 10-06-2007 Through 15-06-2007",
}