Abstract
The microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers was investigated. The thickness effect of NiO and NiFe on the microscopic domain structure and magnetization reversal in a unidirectional and isotropic exchange-coupled films were also studied. The results showed that the density of the cross-type domain was found to be proportional to exchange basing field.
Original language | English |
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Pages (from-to) | ES04 |
Journal | Digests of the Intermag Conference |
State | Published - 2002 |
Event | 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands Duration: 28 Apr 2002 → 2 May 2002 |