Measurement of femto-farad gate capacitance of a silicon nanowire FET using time-domain pulse response

  • D. W. Kim
  • , H. T. Kim
  • , D. H. Hwang
  • , M. G. Kang
  • , J. H. Lee
  • , D. Whang
  • , S. W. Hwang

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Scopus citations

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Physics