Investigation of luminescent properties of low voltage phosphors for the FED applications

J. E. Jang; Y. W. Jin; J. E. Jung; Y. C. You; H. S. Park; W. K. Yi; J. M. Kim

Investigation of luminescent properties of low voltage phosphors for the FED applications

J. E. Jang, Y. W. Jin, J. E. Jung, Y. C. You, H. S. Park, W. K. Yi, J. M. Kim

Department of Electrical Engineering and Computer Science

Samsung

Research output: Contribution to conference › Paper › peer-review

1 Scopus citations

Abstract

Low voltage phosphors for the application to field emission display devices were deposited on the indium tin oxide glasses by utilizing electrophoretic method. The thickness of phosphor screen was carefully varied in order to get the highest brightness. The excitation and measurement of phosphor screen were performed by two different methods in this experiment; the field emitter array and commercial electron gun. Our results showed that 1.5-2 layer of phosphor screen has optimal brightness in our experimental condition. Above results have same trend for two types of excitation sources of phosphor.

Original language	English
Pages	71-72
Number of pages	2
State	Published - 1998
Event	Proceedings of the 1998 11th International Vacuum Microelectronics Conference, IVMC - Asheville, NC, USA Duration: 19 Jul 1998 → 24 Jul 1998

Conference

Conference	Proceedings of the 1998 11th International Vacuum Microelectronics Conference, IVMC
City	Asheville, NC, USA
Period	19/07/98 → 24/07/98

Cite this

@conference{484d519e08b0407c9075556086f1d867,

title = "Investigation of luminescent properties of low voltage phosphors for the FED applications",

abstract = "Low voltage phosphors for the application to field emission display devices were deposited on the indium tin oxide glasses by utilizing electrophoretic method. The thickness of phosphor screen was carefully varied in order to get the highest brightness. The excitation and measurement of phosphor screen were performed by two different methods in this experiment; the field emitter array and commercial electron gun. Our results showed that 1.5-2 layer of phosphor screen has optimal brightness in our experimental condition. Above results have same trend for two types of excitation sources of phosphor.",

author = "Jang, {J. E.} and Jin, {Y. W.} and Jung, {J. E.} and You, {Y. C.} and Park, {H. S.} and Yi, {W. K.} and Kim, {J. M.}",

year = "1998",

language = "English",

pages = "71--72",

note = "Proceedings of the 1998 11th International Vacuum Microelectronics Conference, IVMC ; Conference date: 19-07-1998 Through 24-07-1998",

}

TY - CONF

T1 - Investigation of luminescent properties of low voltage phosphors for the FED applications

AU - Jang, J. E.

AU - Jin, Y. W.

AU - Jung, J. E.

AU - You, Y. C.

AU - Park, H. S.

AU - Yi, W. K.

AU - Kim, J. M.

PY - 1998

Y1 - 1998

N2 - Low voltage phosphors for the application to field emission display devices were deposited on the indium tin oxide glasses by utilizing electrophoretic method. The thickness of phosphor screen was carefully varied in order to get the highest brightness. The excitation and measurement of phosphor screen were performed by two different methods in this experiment; the field emitter array and commercial electron gun. Our results showed that 1.5-2 layer of phosphor screen has optimal brightness in our experimental condition. Above results have same trend for two types of excitation sources of phosphor.

AB - Low voltage phosphors for the application to field emission display devices were deposited on the indium tin oxide glasses by utilizing electrophoretic method. The thickness of phosphor screen was carefully varied in order to get the highest brightness. The excitation and measurement of phosphor screen were performed by two different methods in this experiment; the field emitter array and commercial electron gun. Our results showed that 1.5-2 layer of phosphor screen has optimal brightness in our experimental condition. Above results have same trend for two types of excitation sources of phosphor.

UR - http://www.scopus.com/inward/record.url?scp=0032315889&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0032315889

SP - 71

EP - 72

T2 - Proceedings of the 1998 11th International Vacuum Microelectronics Conference, IVMC

Y2 - 19 July 1998 through 24 July 1998

ER -

Investigation of luminescent properties of low voltage phosphors for the FED applications

Abstract

Conference

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