Influence of film thickness on the electrical and magnetic properties of Co-Fe-Al-O films

M. H. Phan, L. A. Tuan, N. D. Ha, T. L. Phan, C. G. Kim, C. O. Kim, S. C. Yu

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations

Abstract

Influence of film thickness (t) on the electrical and magnetic properties of Co-Fe-Al-O films has been systematically investigated via means of vibrating sample magnetometry (VSM), permeability spectra and magneto-optical Kerr effect (MOKE). It is found that the electrical resistivity (ρ) decreases as the film thickness increases; ρ = 412.5 μΩmcm for the t = 600 nm sample decreases to ρ = 368.2 μΩcm for the t = 1200 nm sample. The coercive force, measured along the easy-axis direction, decreases as the film thickness increases. Interestingly, along the hard-axis magnetization direction, the magnetic hysteresis loop is reversed and the coercive force is negative for the t = 600 and 800 nm samples. However, this peculiar feature disappears as t reaches 1200 nm, which is probably attributed to the microstructural change with respect to changes of film thickness. At a frequency of 1GHz, the hard-axis effective permeability decreases from 1252 to 1000 as the film thickness increases from 600 to 1200 nm, respectively. The VSM and MOKE results reveal an increase in magnetic anisotropy in the near-surface region of the film.

Original languageEnglish
Pages (from-to)4589-4592
Number of pages4
JournalPhysica Status Solidi (C) Current Topics in Solid State Physics
Volume4
Issue number12
DOIs
StatePublished - 2007
EventInternational Symposium on Advanced Magnetic Materials and Appilications, (ISAMMA 2007) - Jeju, Korea, Republic of
Duration: 28 May 20071 Jun 2007

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