Abstract
The effects of Ag doping on the structural, electrical, optical, and photoluminescence properties of sol-gel derived Al rich zinc oxide (Ag-AZO) films are studied. The Al/Zn atomic ratio was constant (∼20%) in all the films, whereas the Ag/Zn atomic ratio varied from 0% to 3%. All the films were highly transparent in the 400-1200 nm wavelength range. The XRD results and surface morphologies of the films confirmed that the grain size increased with Ag doping. The optical band gap (Eg) of the Ag-AZO film first decreased to a value of ∼3.31 eV for a 1% Ag/Zn atomic ratio from a value of ∼3.69 for undoped AZO film. For higher values (beyond a 1% Ag/Zn atomic ratio) of Ag doping, the values of Eg started to increase and finally attained a value of ∼3.66 eV for an Ag/Zn 3% atomic ratio. The photoluminescence (PL) studies showed that the relative PL intensity of the Ag-AZO films in blue (IB) and green (IG) regions increased with Ag doping. The PL positions of these peaks were blue shifted with increased Ag content up to an Ag/Zn atomic ratio of 3%. The increase in I B and IG is due to the charge difference between Ag + and Zn2+, whereas shifting of the PL positions is due to the size of Ag+ and Zn2+ ions.
Original language | English |
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Pages (from-to) | 190-194 |
Number of pages | 5 |
Journal | Journal of Alloys and Compounds |
Volume | 584 |
DOIs | |
State | Published - 2014 |
Bibliographical note
Funding Information:This work was financially supported by the Pioneer Research Center Program through the National Research Foundation of Korea (2011-0001649) by the Ministry of Education, Science and Technology (MEST) , Ministry of Trade, Industry & Energy (MOTIE) , Korea Institute for Advancement of Technology (KIAT) , Dae Gyeong Institute for Regional Program Evaluation (DGIRPE) through the Leading Industry Development for Economic Region and partially funded by the Energy International Collaboration Research & Development Program of the Ministry of Knowledge Economy (MKE) (2011-8520010050).
Keywords
- Optical properties
- Scanning electron microscopy
- Sol-gel process
- Thin films
- X-ray diffraction