Abstract
Recent NAND flash devices have large page sizes. Although large pages are useful in increasing the flash capacity, they can degrade both the performance and lifetime of flash storage systems when small writes are dominant. We propose a new NAND programming scheme, called erase-free sub-page programming (ESP), which allows the same page to be programmed multiple times for small writes. By avoiding internal fragmentation, the ESP scheme reduces the overhead of garbage collection for large-page NAND storages. Experimental results show that an ESP-aware FTL can improve the IOPS and lifetime by up to 74% and 177%, respectively.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 54th Annual Design Automation Conference 2017, DAC 2017 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9781450349277 |
| DOIs | |
| State | Published - 18 Jun 2017 |
| Event | 54th Annual Design Automation Conference, DAC 2017 - Austin, United States Duration: 18 Jun 2017 → 22 Jun 2017 |
Publication series
| Name | Proceedings - Design Automation Conference |
|---|---|
| Volume | Part 128280 |
| ISSN (Print) | 0738-100X |
Conference
| Conference | 54th Annual Design Automation Conference, DAC 2017 |
|---|---|
| Country/Territory | United States |
| City | Austin |
| Period | 18/06/17 → 22/06/17 |
Bibliographical note
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