Improved face detection method using edge histogram feature in the infrared images

Sang Heon Lee; Myoung Kyu Sohn; Byungmin Kim; Jangwoo Lee; Chiho Park; Chul Ho Won

Improved face detection method using edge histogram feature in the infrared images

Sang Heon Lee, Myoung Kyu Sohn, Byungmin Kim, Jangwoo Lee, Chiho Park, Chul Ho Won

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In this paper, a face detection method using a new feature, edge histogram feature, with a support vector machine (SVM) in the near-infrared (NIR) images is proposed. The edge histogram feature is extracted using 16-directional edge intensity and a histogram. Compared to the previous method using local binary pattern (LBP) feature, the proposed method using edge histogram feature has better performance in both smaller feature size and lower equal error rate (EER) for face detection experiments in NIR databases.

Original language	English
Title of host publication	Proceedings of the ISCA 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011
Pages	248-250
Number of pages	3
State	Published - 2011
Event	24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011 - Honolulu, HI, United States Duration: 16 Nov 2011 → 18 Nov 2011

Publication series

Name	Proceedings of the ISCA 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011

Conference

Conference	24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011
Country/Territory	United States
City	Honolulu, HI
Period	16/11/11 → 18/11/11

Keywords

Face detection
Local binary pattern (LBP)
Support vector machine (SVM)

Cite this

Lee, S. H., Sohn, M. K., Kim, B., Lee, J., Park, C., & Won, C. H. (2011). Improved face detection method using edge histogram feature in the infrared images. In Proceedings of the ISCA 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011 (pp. 248-250). (Proceedings of the ISCA 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011).

Lee, Sang Heon ; Sohn, Myoung Kyu ; Kim, Byungmin et al. / Improved face detection method using edge histogram feature in the infrared images. Proceedings of the ISCA 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011. 2011. pp. 248-250 (Proceedings of the ISCA 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011).

@inproceedings{5f2120ae02ed417aa6f2241e81868536,

title = "Improved face detection method using edge histogram feature in the infrared images",

abstract = "In this paper, a face detection method using a new feature, edge histogram feature, with a support vector machine (SVM) in the near-infrared (NIR) images is proposed. The edge histogram feature is extracted using 16-directional edge intensity and a histogram. Compared to the previous method using local binary pattern (LBP) feature, the proposed method using edge histogram feature has better performance in both smaller feature size and lower equal error rate (EER) for face detection experiments in NIR databases.",

keywords = "Face detection, Local binary pattern (LBP), Support vector machine (SVM)",

author = "Lee, {Sang Heon} and Sohn, {Myoung Kyu} and Byungmin Kim and Jangwoo Lee and Chiho Park and Won, {Chul Ho}",

year = "2011",

language = "English",

isbn = "9781880843833",

series = "Proceedings of the ISCA 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011",

pages = "248--250",

booktitle = "Proceedings of the ISCA 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011",

note = "24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011 ; Conference date: 16-11-2011 Through 18-11-2011",

}

Lee, SH, Sohn, MK, Kim, B, Lee, J, Park, C & Won, CH 2011, Improved face detection method using edge histogram feature in the infrared images. in Proceedings of the ISCA 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011. Proceedings of the ISCA 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011, pp. 248-250, 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011, Honolulu, HI, United States, 16/11/11.

Improved face detection method using edge histogram feature in the infrared images. / Lee, Sang Heon; Sohn, Myoung Kyu; Kim, Byungmin et al.
Proceedings of the ISCA 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011. 2011. p. 248-250 (Proceedings of the ISCA 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Improved face detection method using edge histogram feature in the infrared images

AU - Lee, Sang Heon

AU - Sohn, Myoung Kyu

AU - Kim, Byungmin

AU - Lee, Jangwoo

AU - Park, Chiho

AU - Won, Chul Ho

PY - 2011

Y1 - 2011

N2 - In this paper, a face detection method using a new feature, edge histogram feature, with a support vector machine (SVM) in the near-infrared (NIR) images is proposed. The edge histogram feature is extracted using 16-directional edge intensity and a histogram. Compared to the previous method using local binary pattern (LBP) feature, the proposed method using edge histogram feature has better performance in both smaller feature size and lower equal error rate (EER) for face detection experiments in NIR databases.

AB - In this paper, a face detection method using a new feature, edge histogram feature, with a support vector machine (SVM) in the near-infrared (NIR) images is proposed. The edge histogram feature is extracted using 16-directional edge intensity and a histogram. Compared to the previous method using local binary pattern (LBP) feature, the proposed method using edge histogram feature has better performance in both smaller feature size and lower equal error rate (EER) for face detection experiments in NIR databases.

KW - Face detection

KW - Local binary pattern (LBP)

KW - Support vector machine (SVM)

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M3 - Conference contribution

AN - SCOPUS:84871971153

SN - 9781880843833

T3 - Proceedings of the ISCA 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011

SP - 248

EP - 250

BT - Proceedings of the ISCA 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011

T2 - 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011

Y2 - 16 November 2011 through 18 November 2011

ER -

Lee SH, Sohn MK, Kim B, Lee J, Park C, Won CH. Improved face detection method using edge histogram feature in the infrared images. In Proceedings of the ISCA 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011. 2011. p. 248-250. (Proceedings of the ISCA 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011).

Improved face detection method using edge histogram feature in the infrared images

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Keywords

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