TY - JOUR
T1 - High-Resolution and Large-Area Patterning of Highly Conductive Silver Nanowire Electrodes by Reverse Offset Printing and Intense Pulsed Light Irradiation
AU - Park, Kyutae
AU - Woo, Kyoohee
AU - Kim, Jongyoun
AU - Lee, Donghwa
AU - Ahn, Yumi
AU - Song, Dongha
AU - Kim, Honggi
AU - Oh, Dongho
AU - Kwon, Sin
AU - Lee, Youngu
N1 - Publisher Copyright:
© 2019 American Chemical Society.
PY - 2019/4/24
Y1 - 2019/4/24
N2 - Conventional printing technologies such as inkjet, screen, and gravure printing have been used to fabricate patterns of silver nanowire (AgNW) transparent conducting electrodes (TCEs) for a variety of electronic devices. However, they have critical limitations in achieving micrometer-scale fine line width, uniform thickness, sharp line edge, and pattering of various shapes. Moreover, the optical and electrical properties of printed AgNW patterns do not satisfy the performance required by flexible integrated electronic devices. Here, we report a high-resolution and large-area patterning of highly conductive AgNW TCEs by reverse offset printing and intense pulsed light (IPL) irradiation for flexible integrated electronic devices. A conductive AgNW ink for reverse offset printing is prepared by carefully adjusting the composition of AgNW content, solvents, surface energy modifiers, and organic binders for the first time. High-quality and high-resolution AgNW micropatterns with various shapes and line widths are successfully achieved on a large-area plastic substrate (120 × 100 mm 2 ) by optimizing the process parameters of reverse offset printing. The reverse offset printed AgNW micropatterns exhibit superior fine line widths (up to 6 μm) and excellent pattern quality such as sharp line edge, fine line spacing, effective wire junction connection, and smooth film roughness. They are post-processed with IPL irradiation, thereby realizing excellent optical, electrical, and mechanical properties. Furthermore, flexible OLEDs and heaters based on reverse offset printed AgNW micropatterns are successfully fabricated and characterized, demonstrating the potential use of the reverse offset printing for the conductive AgNW ink.
AB - Conventional printing technologies such as inkjet, screen, and gravure printing have been used to fabricate patterns of silver nanowire (AgNW) transparent conducting electrodes (TCEs) for a variety of electronic devices. However, they have critical limitations in achieving micrometer-scale fine line width, uniform thickness, sharp line edge, and pattering of various shapes. Moreover, the optical and electrical properties of printed AgNW patterns do not satisfy the performance required by flexible integrated electronic devices. Here, we report a high-resolution and large-area patterning of highly conductive AgNW TCEs by reverse offset printing and intense pulsed light (IPL) irradiation for flexible integrated electronic devices. A conductive AgNW ink for reverse offset printing is prepared by carefully adjusting the composition of AgNW content, solvents, surface energy modifiers, and organic binders for the first time. High-quality and high-resolution AgNW micropatterns with various shapes and line widths are successfully achieved on a large-area plastic substrate (120 × 100 mm 2 ) by optimizing the process parameters of reverse offset printing. The reverse offset printed AgNW micropatterns exhibit superior fine line widths (up to 6 μm) and excellent pattern quality such as sharp line edge, fine line spacing, effective wire junction connection, and smooth film roughness. They are post-processed with IPL irradiation, thereby realizing excellent optical, electrical, and mechanical properties. Furthermore, flexible OLEDs and heaters based on reverse offset printed AgNW micropatterns are successfully fabricated and characterized, demonstrating the potential use of the reverse offset printing for the conductive AgNW ink.
KW - high-resolution
KW - intense pulsed light irradiation
KW - patterning
KW - reverse offset printing
KW - silver nanowire
UR - http://www.scopus.com/inward/record.url?scp=85064830470&partnerID=8YFLogxK
U2 - 10.1021/acsami.9b00838
DO - 10.1021/acsami.9b00838
M3 - Article
C2 - 30919616
AN - SCOPUS:85064830470
SN - 1944-8244
VL - 11
SP - 14882
EP - 14891
JO - ACS Applied Materials and Interfaces
JF - ACS Applied Materials and Interfaces
IS - 16
ER -