High-Extinction Reconfigurable Mach-Zehnder Interferometer Based on Silicon Photonic MEMS

  • Dong U. Kim
  • , Min G. Lim
  • , Dong J. Choi
  • , Young J. Park
  • , Man J. Her
  • , Myung S. Hong
  • , Youngjae Jeong
  • , Kyoungsik Yu
  • , Sangyoon Han

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Mach-Zehnder interferometer (MZI) is one of the essential components of photonic integrated circuits (PICs), such as quantum applications and optical neural networks [1,2]. These applications demand a high dynamic range between on and off state. However, due to the fabrication imperfection, their modulation extinction is limited. There are some approaches to achieve a high modulation extinction of MZI and basic concept is to use additional MZIs to compensate the optical power distribution error (splitter and combiner) [3,4]. However, their modulation mechanisms are based on thermo-optic effect which consumes high electrical power. Also, the thermal crosstalk between the devices is the bottleneck for large-scale PICs. The micro-electro mechanical system (MEMS) based PIC is one of the solutions, and recently large-scale MEMS PICs have been reported [5].

Original languageEnglish
Title of host publication2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350345995
DOIs
StatePublished - 2023
Event2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023 - Munich, Germany
Duration: 26 Jun 202330 Jun 2023

Publication series

Name2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023

Conference

Conference2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023
Country/TerritoryGermany
CityMunich
Period26/06/2330/06/23

Bibliographical note

Publisher Copyright:
© 2023 IEEE.

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