Gate-controlled magnetic properties of the magnetic semiconductor (Zn,Co)O

H. J. Lee, E. Helgren, F. Hellman

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Abstract

Electric field-controlled ferromagnetism of (Zn,Co)O is demonstrated via anomalous Hall effect measurements. The electron carrier concentration in this material is 1.65× 1020 cm-3 as measured via ordinary Hall effect at 4 K, and an anomalous Hall effect is observed up to 6 K, but with no hysteresis at any temperature. With positive electric gate field, the carrier concentration is increased by approximately 2%, resulting in a clear magnetic hysteresis at 4 K. The ability to reversibly induce/eliminate ferromagnetism by applied gate field alone, measured via the effect on the carriers, is a clear sign of carrier-induced ferromagnetism in this system.

Original languageEnglish
Article number212106
JournalApplied Physics Letters
Volume94
Issue number21
DOIs
StatePublished - 2009

Bibliographical note

Funding Information:
We would like to thank Danial Queen and Micol Alemani for discussions and help. Materials synthesis and characterization were supported by DOE Division of Materials Sciences and Engineering under Contract No. DE-AC02-05CH11231 and device fabrication and analysis were supported by Western Institute of Nanoelectronics.

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