Free-layer thickness dependence of GMR in Co/Permalloy/Co/Cu/Co multilayers

Tae Hyo Lee, Young Woo Lee, Cheol Gi Kim, Chong Oh Kim, D. Y. Kim, Yong Choi

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

The magnetoresistance (MR) of Co (1)/Permalloy (t)/Co (0.4)/Cu (3.6)/Co (5) (nm) multilayers has been measured as a function of the free-layer thickness and temperature down 30K. The MR ratio decreases with small oscillations as the thickness of the free layer increases from 5 to 11nm, where the oscillation period is about 1nm. The MR behavior is dominantly affected by volume magnetic characteristics. The MR ratio increases as the measuring temperature decreases down to 100K, but then is followed by an increase, where the increasing rate of change of MR with decreasing temperature is also oscillatory with free-layer thickness.

Original languageEnglish
Pages (from-to)291-294
Number of pages4
JournalPhysica B: Condensed Matter
Volume328
Issue number3-4
DOIs
StatePublished - May 2003

Bibliographical note

Funding Information:
This work was supported by the Korea Science and Engineering Foundation through the Research Center for Advanced Magnetic Materials (ReCAMM).

Keywords

  • Free-layer thickness
  • Giant magnetoresistance
  • Temperature dependence of magnetoresistance

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