Focal Field Engineered Infrared-sensitive Third-order Sum Frequency Generation Microscopy

Jyothsna Konkada Manattayil, Lal A.S. Krishna, Hyunmin Kim, Varun Raghunathan

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this work we present experimental demonstration of focal-field engineering in infrared-sensitive third-order sum frequency generation (TSFG) microscopy by utilizing beam-shaping technique. Two photons of the input mid-infrared (MIR) beam at 3000 nm are upconverted to 615 nm in the presence of a single photon at 1040 nm through the TSFG process. The focal-field engineering scheme studied here improves optical resolution and contrast of the TSFG imaging. We observe best improvement of ~43 % in the central-lobe full-width half diameter with ~35% side-lobe strength of that of the central-lobe with the use of optimum phase-mask using isolated amorphous silicon (a-Si) nano disks as the sample. We compare the contrast enhancement between the experiments and simulations as a function of varying grating pitch and find good overall agreement between the two. In addition to annular phase masks, we also demonstrate edge contrast enhancement by imaging gratings with higher-order Hermite-Gaussian beams profile generated using horizontally partitioned 0- phase profile.

Original languageEnglish
Title of host publicationBiomedical Spectroscopy, Microscopy, and Imaging II
EditorsJurgen Popp, Csilla Gergely
PublisherSPIE
ISBN (Electronic)9781510651647
DOIs
StatePublished - 2022
EventBiomedical Spectroscopy, Microscopy, and Imaging II 2022 - Virtual, Online
Duration: 9 May 202220 May 2022

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12144
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceBiomedical Spectroscopy, Microscopy, and Imaging II 2022
CityVirtual, Online
Period9/05/2220/05/22

Bibliographical note

Publisher Copyright:
© 2022 SPIE.

Keywords

  • Nonlinear microscopy
  • amorphous silicon
  • higher order Hermite Gaussian mode
  • super resolution microscopy
  • third order sum frequency generation microscopy

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