Fabrication and characteristics of an FET-type charge sensor for detecting DNA sequence

Yong Taek Jeong; Dong Sun Kim; Hong Kun Lyu; Hey Jung Park; Hyoung Sik Kim; Jang Kyoo Shin; Pyung Choi; Jong Hyun Lee; G. Lim; M. Ishida

doi:10.1109/IMNC.2002.1178656

Fabrication and characteristics of an FET-type charge sensor for detecting DNA sequence

Yong Taek Jeong, Dong Sun Kim, Hong Kun Lyu, Hey Jung Park, Hyoung Sik Kim, Jang Kyoo Shin, Pyung Choi, Jong Hyun Lee, G. Lim, M. Ishida

Division of Electronics & Information System

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

The authors have fabricated an FET-type DNA charge sensor which can detect DNA sequence by sensing a the variation of drain current due to DNA hybridization and investigated its electrical characteristics.

Original language	English
Title of host publication	2002 International Microprocesses and Nanotechnology Conference, MNC 2002
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	288-289
Number of pages	2
ISBN (Electronic)	4891140313, 9784891140311
DOIs	https://doi.org/10.1109/IMNC.2002.1178656
State	Published - 2002
Event	International Microprocesses and Nanotechnology Conference, MNC 2002 - Tokyo, Japan Duration: 6 Nov 2002 → 8 Nov 2002

Publication series

Name	2002 International Microprocesses and Nanotechnology Conference, MNC 2002

Conference

Conference	International Microprocesses and Nanotechnology Conference, MNC 2002
Country/Territory	Japan
City	Tokyo
Period	6/11/02 → 8/11/02

Bibliographical note

Publisher Copyright:
© 2002 IEEE.

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10.1109/IMNC.2002.1178656

Cite this

Jeong, Y. T., Kim, D. S., Lyu, H. K., Park, H. J., Kim, H. S., Shin, J. K., Choi, P., Lee, J. H., Lim, G., & Ishida, M. (2002). Fabrication and characteristics of an FET-type charge sensor for detecting DNA sequence. In 2002 International Microprocesses and Nanotechnology Conference, MNC 2002 (pp. 288-289). Article 1178656 (2002 International Microprocesses and Nanotechnology Conference, MNC 2002). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IMNC.2002.1178656

Jeong, Yong Taek ; Kim, Dong Sun ; Lyu, Hong Kun et al. / Fabrication and characteristics of an FET-type charge sensor for detecting DNA sequence. 2002 International Microprocesses and Nanotechnology Conference, MNC 2002. Institute of Electrical and Electronics Engineers Inc., 2002. pp. 288-289 (2002 International Microprocesses and Nanotechnology Conference, MNC 2002).

@inproceedings{56e19eaad2b342b1b6c523e2227549aa,

title = "Fabrication and characteristics of an FET-type charge sensor for detecting DNA sequence",

abstract = "The authors have fabricated an FET-type DNA charge sensor which can detect DNA sequence by sensing a the variation of drain current due to DNA hybridization and investigated its electrical characteristics.",

author = "Jeong, {Yong Taek} and Kim, {Dong Sun} and Lyu, {Hong Kun} and Park, {Hey Jung} and Kim, {Hyoung Sik} and Shin, {Jang Kyoo} and Pyung Choi and Lee, {Jong Hyun} and G. Lim and M. Ishida",

note = "Publisher Copyright: {\textcopyright} 2002 IEEE.; International Microprocesses and Nanotechnology Conference, MNC 2002 ; Conference date: 06-11-2002 Through 08-11-2002",

year = "2002",

doi = "10.1109/IMNC.2002.1178656",

language = "English",

series = "2002 International Microprocesses and Nanotechnology Conference, MNC 2002",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "288--289",

booktitle = "2002 International Microprocesses and Nanotechnology Conference, MNC 2002",

}

Jeong, YT, Kim, DS, Lyu, HK, Park, HJ, Kim, HS, Shin, JK, Choi, P, Lee, JH, Lim, G & Ishida, M 2002, Fabrication and characteristics of an FET-type charge sensor for detecting DNA sequence. in 2002 International Microprocesses and Nanotechnology Conference, MNC 2002., 1178656, 2002 International Microprocesses and Nanotechnology Conference, MNC 2002, Institute of Electrical and Electronics Engineers Inc., pp. 288-289, International Microprocesses and Nanotechnology Conference, MNC 2002, Tokyo, Japan, 6/11/02. https://doi.org/10.1109/IMNC.2002.1178656

Fabrication and characteristics of an FET-type charge sensor for detecting DNA sequence. / Jeong, Yong Taek; Kim, Dong Sun; Lyu, Hong Kun et al.
2002 International Microprocesses and Nanotechnology Conference, MNC 2002. Institute of Electrical and Electronics Engineers Inc., 2002. p. 288-289 1178656 (2002 International Microprocesses and Nanotechnology Conference, MNC 2002).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Fabrication and characteristics of an FET-type charge sensor for detecting DNA sequence

AU - Jeong, Yong Taek

AU - Kim, Dong Sun

AU - Lyu, Hong Kun

AU - Park, Hey Jung

AU - Kim, Hyoung Sik

AU - Shin, Jang Kyoo

AU - Choi, Pyung

AU - Lee, Jong Hyun

AU - Lim, G.

AU - Ishida, M.

PY - 2002

Y1 - 2002

N2 - The authors have fabricated an FET-type DNA charge sensor which can detect DNA sequence by sensing a the variation of drain current due to DNA hybridization and investigated its electrical characteristics.

AB - The authors have fabricated an FET-type DNA charge sensor which can detect DNA sequence by sensing a the variation of drain current due to DNA hybridization and investigated its electrical characteristics.

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DO - 10.1109/IMNC.2002.1178656

M3 - Conference contribution

AN - SCOPUS:84960371583

T3 - 2002 International Microprocesses and Nanotechnology Conference, MNC 2002

SP - 288

EP - 289

BT - 2002 International Microprocesses and Nanotechnology Conference, MNC 2002

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - International Microprocesses and Nanotechnology Conference, MNC 2002

Y2 - 6 November 2002 through 8 November 2002

ER -

Jeong YT, Kim DS, Lyu HK, Park HJ, Kim HS, Shin JK et al. Fabrication and characteristics of an FET-type charge sensor for detecting DNA sequence. In 2002 International Microprocesses and Nanotechnology Conference, MNC 2002. Institute of Electrical and Electronics Engineers Inc. 2002. p. 288-289. 1178656. (2002 International Microprocesses and Nanotechnology Conference, MNC 2002). doi: 10.1109/IMNC.2002.1178656

Fabrication and characteristics of an FET-type charge sensor for detecting DNA sequence

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