Experimental observation of the characteristic relations of type-I intermittency in the presence of noise

Recently, it has been reported that the characteristic relation of type-I intermittency in the presence of noise is deformed nontrivially as the channel width [formula presented] changes from the positive region to the negative. In order to verify it experimentally as a real phenomenon, we study the characteristic relations both for [formula presented] and for [formula presented] in a simple inductor-resistor-diode circuit that is under noisy circumstances. The experimental results agree well with the theoretical expectation that the characteristic relations are [formula presented] for [formula presented] and [formula presented] for [formula presented].