Experimental observation of characteristic relations of type-III intermittency in the presence of noise in a simple electronic circuit

We investigate the characteristic relations of type-II and -III intermittencies in the presence of noise. The theoretically predicted characteristic relation is that [Formula presented] for a negative regime of ε and [Formula presented] for the positive regime of ε [Formula presented] where [Formula presented] is the average laminar length and [Formula presented] is the slope of the local Poincaré map around the tangent point. We experimentally confirm these relations in a simple electronic circuit.