Experimental evidence of characteristic relations of type-i intermittency in an electronic circuit

Chil Mim Kim; Geo Su Yim; Yeon Soo Kim; Jeong Moog Kim; H. W. Lee

doi:10.1103/PhysRevE.56.2573

Experimental evidence of characteristic relations of type-i intermittency in an electronic circuit

Chil Mim Kim, Geo Su Yim, Yeon Soo Kim, Jeong Moog Kim, H. W. Lee

Department of Physics and Chemistry

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26 Scopus citations

Abstract

We experimentally observe the characteristic relations of type-I intermittency [C.-M. Kim et al., Phys. Rev. Lett. 73, 525 (1994)] in an inductance-resistance-diode circuit. Near a bifurcation point, the reinjection probability distribution is of the form [Formula Presented], and the characteristic relations are of the form [Formula Presented] and constant when the lower bounds of the reinjection are at and above the tangent point, respectively. The results agree well with theoretical predictions.

Original language	English
Pages (from-to)	2573-2579
Number of pages	7
Journal	Physical Review E - Statistical, Nonlinear, and Soft Matter Physics
Volume	55
Issue number	3
DOIs	https://doi.org/10.1103/PhysRevE.56.2573
State	Published - 1997

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title = "Experimental evidence of characteristic relations of type-i intermittency in an electronic circuit",

abstract = "We experimentally observe the characteristic relations of type-I intermittency [C.-M. Kim et al., Phys. Rev. Lett. 73, 525 (1994)] in an inductance-resistance-diode circuit. Near a bifurcation point, the reinjection probability distribution is of the form [Formula Presented], and the characteristic relations are of the form [Formula Presented] and constant when the lower bounds of the reinjection are at and above the tangent point, respectively. The results agree well with theoretical predictions.",

author = "Kim, \{Chil Mim\} and Yim, \{Geo Su\} and Kim, \{Yeon Soo\} and Kim, \{Jeong Moog\} and Lee, \{H. W.\}",

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language = "English",

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pages = "2573--2579",

journal = "Physical Review E - Statistical, Nonlinear, and Soft Matter Physics",

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T1 - Experimental evidence of characteristic relations of type-i intermittency in an electronic circuit

AU - Kim, Chil Mim

AU - Yim, Geo Su

AU - Kim, Yeon Soo

AU - Kim, Jeong Moog

AU - Lee, H. W.

PY - 1997

Y1 - 1997

N2 - We experimentally observe the characteristic relations of type-I intermittency [C.-M. Kim et al., Phys. Rev. Lett. 73, 525 (1994)] in an inductance-resistance-diode circuit. Near a bifurcation point, the reinjection probability distribution is of the form [Formula Presented], and the characteristic relations are of the form [Formula Presented] and constant when the lower bounds of the reinjection are at and above the tangent point, respectively. The results agree well with theoretical predictions.

AB - We experimentally observe the characteristic relations of type-I intermittency [C.-M. Kim et al., Phys. Rev. Lett. 73, 525 (1994)] in an inductance-resistance-diode circuit. Near a bifurcation point, the reinjection probability distribution is of the form [Formula Presented], and the characteristic relations are of the form [Formula Presented] and constant when the lower bounds of the reinjection are at and above the tangent point, respectively. The results agree well with theoretical predictions.

UR - https://www.scopus.com/pages/publications/0001306299

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DO - 10.1103/PhysRevE.56.2573

M3 - Article

AN - SCOPUS:0001306299

SN - 1063-651X

VL - 55

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EP - 2579

JO - Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

JF - Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

IS - 3

ER -

Experimental evidence of characteristic relations of type-i intermittency in an electronic circuit

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