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Exchange bias investigations in FeMn based multilayers
V. K. Sankaranarayanan
, S. M. Yoon
,
C. G. Kim
, C. O. Kim
Department of Physics and Chemistry
Chungnam National University
CSIR - National Physical Laboratory
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Earth and Planetary Sciences
Investigation
100%
Bias
100%
Show
45%
Thickness
45%
Seed
45%
Increasing
18%
Cause
9%
Loop
9%
Variation
9%
Value
9%
Interlayer
9%
Agricultural and Biological Sciences
Bias
100%
Thickness
45%
Seeds
45%
Surfaces
9%
Microwave Oven
9%
Physics
Exchange Bias
100%
Increasing
18%
Variations
9%
Value
9%