Fingerprint
Dive into the research topics of 'Exchange bias affected by ion beam etching of FeMn surface in Ta/NiFe/FeMn'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Exchange bias affected by ion beam etching of FeMn surface in Ta/NiFe/FeMn
S. M. Yoon, J. J. Lim, Y. W. Lee, C. G. Kim, C. O. Kim
Research output: Contribution to journal › Article › peer-review
1
Scopus
citations