Erratum: Correction to "Accurate Assessments of the Electronic Structures of Ultrathin PtSe2: Bandgap Quantification and Critical Thickness for the Metal-Semiconductor Transition" (ACS applied materials & interfaces (2025) 17 34 DOI: 10.1021/acsami.5c08999.)

Hansung Kim; Janghwan Cha; Jong Hyeok Seo; Beopgil Cho; Jaemun Park; Keeseong Park; Kenji Watanabe; Takashi Taniguchi; Dong Han Ha; Jihwan Kwon; Sunae Seo; Yong Sung Kim; Suyong Jung

doi:10.1021/acsami.5c18563

Erratum: Correction to "Accurate Assessments of the Electronic Structures of Ultrathin PtSe₂: Bandgap Quantification and Critical Thickness for the Metal-Semiconductor Transition" (ACS applied materials & interfaces (2025) 17 34 DOI: 10.1021/acsami.5c08999.)

Hansung Kim
, Janghwan Cha
, Jong Hyeok Seo
, Beopgil Cho
, Jaemun Park
, Keeseong Park
, Kenji Watanabe
, Takashi Taniguchi
, Dong Han Ha
, Jihwan Kwon
, Sunae Seo
, Yong Sung Kim
, Suyong Jung

Department of Physics and Chemistry

Research output: Contribution to journal › Comment/debate

Original language	English
Pages (from-to)	58996
Number of pages	1
Journal	ACS Applied Materials and Interfaces
Volume	17
Issue number	42
DOIs	https://doi.org/10.1021/acsami.5c18563
State	Published - 22 Oct 2025

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10.1021/acsami.5c18563

Cite this

Kim, H., Cha, J., Seo, J. H., Cho, B., Park, J., Park, K., Watanabe, K., Taniguchi, T., Ha, D. H., Kwon, J., Seo, S., Kim, Y. S., & Jung, S. (2025). Erratum: Correction to "Accurate Assessments of the Electronic Structures of Ultrathin PtSe₂: Bandgap Quantification and Critical Thickness for the Metal-Semiconductor Transition" (ACS applied materials & interfaces (2025) 17 34 DOI: 10.1021/acsami.5c08999.). ACS Applied Materials and Interfaces, 17(42), 58996. https://doi.org/10.1021/acsami.5c18563

Kim, Hansung ; Cha, Janghwan ; Seo, Jong Hyeok et al. / Erratum : Correction to "Accurate Assessments of the Electronic Structures of Ultrathin PtSe₂: Bandgap Quantification and Critical Thickness for the Metal-Semiconductor Transition" (ACS applied materials & interfaces (2025) 17 34 DOI: 10.1021/acsami.5c08999.). In: ACS Applied Materials and Interfaces. 2025 ; Vol. 17, No. 42. pp. 58996.

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title = "Erratum: Correction to {"}Accurate Assessments of the Electronic Structures of Ultrathin PtSe2: Bandgap Quantification and Critical Thickness for the Metal-Semiconductor Transition{"} (ACS applied materials \& interfaces (2025) 17 34 DOI: 10.1021/acsami.5c08999.)",

author = "Hansung Kim and Janghwan Cha and Seo, \{Jong Hyeok\} and Beopgil Cho and Jaemun Park and Keeseong Park and Kenji Watanabe and Takashi Taniguchi and Ha, \{Dong Han\} and Jihwan Kwon and Sunae Seo and Kim, \{Yong Sung\} and Suyong Jung",

year = "2025",

month = oct,

day = "22",

doi = "10.1021/acsami.5c18563",

language = "English",

volume = "17",

pages = "58996",

journal = "ACS Applied Materials and Interfaces",

issn = "1944-8244",

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Kim, H, Cha, J, Seo, JH, Cho, B, Park, J, Park, K, Watanabe, K, Taniguchi, T, Ha, DH, Kwon, J, Seo, S, Kim, YS & Jung, S 2025, 'Erratum: Correction to "Accurate Assessments of the Electronic Structures of Ultrathin PtSe₂: Bandgap Quantification and Critical Thickness for the Metal-Semiconductor Transition" (ACS applied materials & interfaces (2025) 17 34 DOI: 10.1021/acsami.5c08999.)', ACS Applied Materials and Interfaces, vol. 17, no. 42, pp. 58996. https://doi.org/10.1021/acsami.5c18563

Erratum: Correction to "Accurate Assessments of the Electronic Structures of Ultrathin PtSe₂: Bandgap Quantification and Critical Thickness for the Metal-Semiconductor Transition" (ACS applied materials & interfaces (2025) 17 34 DOI: 10.1021/acsami.5c08999.). / Kim, Hansung; Cha, Janghwan; Seo, Jong Hyeok et al.
In: ACS Applied Materials and Interfaces, Vol. 17, No. 42, 22.10.2025, p. 58996.

Research output: Contribution to journal › Comment/debate

TY - JOUR

T1 - Erratum

T2 - Correction to "Accurate Assessments of the Electronic Structures of Ultrathin PtSe2: Bandgap Quantification and Critical Thickness for the Metal-Semiconductor Transition" (ACS applied materials & interfaces (2025) 17 34 DOI: 10.1021/acsami.5c08999.)

AU - Kim, Hansung

AU - Cha, Janghwan

AU - Seo, Jong Hyeok

AU - Cho, Beopgil

AU - Park, Jaemun

AU - Park, Keeseong

AU - Watanabe, Kenji

AU - Taniguchi, Takashi

AU - Ha, Dong Han

AU - Kwon, Jihwan

AU - Seo, Sunae

AU - Kim, Yong Sung

AU - Jung, Suyong

PY - 2025/10/22

Y1 - 2025/10/22

UR - https://www.scopus.com/pages/publications/105019821354

U2 - 10.1021/acsami.5c18563

DO - 10.1021/acsami.5c18563

M3 - Comment/debate

C2 - 41058496

AN - SCOPUS:105019821354

SN - 1944-8244

VL - 17

SP - 58996

JO - ACS Applied Materials and Interfaces

JF - ACS Applied Materials and Interfaces

IS - 42

ER -

Kim H, Cha J, Seo JH, Cho B, Park J, Park K et al. Erratum: Correction to "Accurate Assessments of the Electronic Structures of Ultrathin PtSe₂: Bandgap Quantification and Critical Thickness for the Metal-Semiconductor Transition" (ACS applied materials & interfaces (2025) 17 34 DOI: 10.1021/acsami.5c08999.). ACS Applied Materials and Interfaces. 2025 Oct 22;17(42):58996. doi: 10.1021/acsami.5c18563

Erratum: Correction to "Accurate Assessments of the Electronic Structures of Ultrathin PtSe2: Bandgap Quantification and Critical Thickness for the Metal-Semiconductor Transition" (ACS applied materials & interfaces (2025) 17 34 DOI: 10.1021/acsami.5c08999.)

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Erratum: Correction to "Accurate Assessments of the Electronic Structures of Ultrathin PtSe₂: Bandgap Quantification and Critical Thickness for the Metal-Semiconductor Transition" (ACS applied materials & interfaces (2025) 17 34 DOI: 10.1021/acsami.5c08999.)