Effects of surface roughness on the electrical characteristics of ZnO nanowire field effect transistors

Woong Ki Hong, Sunghoon Song, Dae Kue Hwang, Soon Shin Kwon, Gunho Jo, Seong Ju Park, Takhee Lee

Research output: Contribution to journalArticlepeer-review

33 Scopus citations

Abstract

We have systematically investigated the effects of surface roughness on the electrical characteristics of ZnO nanowire field effect transistors (FETs) before and after passivation by poly (methyl metahacrylate) (PMMA), a polymer-insulating layer. To control the surface morphology of ZnO nanowires, ZnO nanowires were grown by the vapor transport method on two different substrates, namely, an Au-catalyzed sapphire and an Au-catalyzed ZnO film/sapphire. ZnO nanowires grown on the Au-catalyzed sapphire substrate had smooth surfaces, whereas those grown on the Au-catalyzed ZnO film had rough surfaces. Electrical characteristics such as the threshold voltage shift and transconductance before and after passivation were strongly affected by the surface morphology of ZnO nanowires.

Original languageEnglish
Pages (from-to)7559-7564
Number of pages6
JournalApplied Surface Science
Volume254
Issue number23
DOIs
StatePublished - 30 Sep 2008

Keywords

  • Field effect transistor
  • Nanowire
  • Passivation
  • Surface roughness
  • ZnO

Fingerprint

Dive into the research topics of 'Effects of surface roughness on the electrical characteristics of ZnO nanowire field effect transistors'. Together they form a unique fingerprint.

Cite this