Abstract
In this study, we demonstrate a mobility enhancement structure for fully transparent amorphous indium-gallium-zinc-oxide thin-film transistors (a-IGZO TFTs) by embedding a holographically generated periodic nano-conductor in the back-channel regions. The intrinsic field-effect mobility was enhanced up to 2 times compared to that of a reference sample. The enhancement originated from a decrease in the effective channel length due to the highly conductive nano-conductor region. By combining conventional and holographic lithography, the performance of the a-IGZO TFT can be effectively improved without varying the composition of the channel layer.
Original language | English |
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Article number | 085311 |
Journal | AIP Advances |
Volume | 6 |
Issue number | 8 |
DOIs | |
State | Published - 1 Aug 2016 |
Bibliographical note
Publisher Copyright:© 2016 Author(s).