Effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multiplayer

Young Woo Lee; Tae Hyo Lee; Cheol Gi Kim; Chong Oh Kim; Tae Sick Yoon

Effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multiplayer

Young Woo Lee
, Tae Hyo Lee
, Cheol Gi Kim
, Chong Oh Kim
, Tae Sick Yoon

Department of Physics and Chemistry

Research output: Contribution to journal › Conference article › peer-review

Abstract

An effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multilayer was discussed. The Mumetal/AlOx/Co multilayers were deposited on the silicon wafer with thermally grown SiO₂. The cross sectional transmission electron microscopy (TEM) image of magnetic tunnel junction (MTJ) multilayer was shown. Crystalline phase and grain size were measured by x-ray diffraction.

Original language	English
Pages (from-to)	ES12
Journal	Digests of the Intermag Conference
State	Published - 2002
Event	2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands Duration: 28 Apr 2002 → 2 May 2002

Cite this

@article{d6c79e3e460e4c8db06e2d8b8d14f8a5,

title = "Effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multiplayer",

abstract = "An effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multilayer was discussed. The Mumetal/AlOx/Co multilayers were deposited on the silicon wafer with thermally grown SiO2. The cross sectional transmission electron microscopy (TEM) image of magnetic tunnel junction (MTJ) multilayer was shown. Crystalline phase and grain size were measured by x-ray diffraction.",

author = "Lee, \{Young Woo\} and Lee, \{Tae Hyo\} and Kim, \{Cheol Gi\} and Kim, \{Chong Oh\} and Yoon, \{Tae Sick\}",

year = "2002",

language = "English",

pages = "ES12",

journal = "Digests of the Intermag Conference",

issn = "0074-6843",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG ; Conference date: 28-04-2002 Through 02-05-2002",

}

TY - JOUR

T1 - Effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multiplayer

AU - Lee, Young Woo

AU - Lee, Tae Hyo

AU - Kim, Cheol Gi

AU - Kim, Chong Oh

AU - Yoon, Tae Sick

PY - 2002

Y1 - 2002

N2 - An effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multilayer was discussed. The Mumetal/AlOx/Co multilayers were deposited on the silicon wafer with thermally grown SiO2. The cross sectional transmission electron microscopy (TEM) image of magnetic tunnel junction (MTJ) multilayer was shown. Crystalline phase and grain size were measured by x-ray diffraction.

AB - An effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multilayer was discussed. The Mumetal/AlOx/Co multilayers were deposited on the silicon wafer with thermally grown SiO2. The cross sectional transmission electron microscopy (TEM) image of magnetic tunnel junction (MTJ) multilayer was shown. Crystalline phase and grain size were measured by x-ray diffraction.

UR - https://www.scopus.com/pages/publications/0036912617

M3 - Conference article

AN - SCOPUS:0036912617

SN - 0074-6843

SP - ES12

JO - Digests of the Intermag Conference

JF - Digests of the Intermag Conference

T2 - 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG

Y2 - 28 April 2002 through 2 May 2002

ER -

Effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multiplayer

Abstract

Other files and links

Fingerprint

Cite this