Effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multiplayer

Young Woo Lee; T. H. Lee; C. G. Kim; C. O. Kim; T. S. Yoon

doi:10.1109/INTMAG.2002.1001198

Effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multiplayer

Young Woo Lee, T. H. Lee, C. G. Kim, C. O. Kim, T. S. Yoon

Department of Physics and Chemistry

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Magnetic tunnel junction (MTJ) composed of ferromagnetic (FM1)/insulator (I)/ ferromagnetic (FM2) layer have investigated for years because it is believed to realize new and high performance magnetic sensor and memory devices. Flat interfaces were required to get best performance without orange peel coupling between FM1 and FM2. This article shows the cross-sectional TEM image of MTJ multilayer. The large curvature of insulator layer is shown at the grain boundary region of FM1. For this purpose, we tried to decrease grain boundary density ς per unit area by increasing grain size of FM1. Then switching field of Mumetal, Hsw1 and exchange coupling field, Hex were measured to see the change of interlayer coupling state.

Original language	English
Title of host publication	INTERMAG Europe 2002 - IEEE International Magnetics Conference
Editors	J. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	0780373650, 9780780373655
DOIs	https://doi.org/10.1109/INTMAG.2002.1001198
State	Published - 2002
Event	2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands Duration: 28 Apr 2002 → 2 May 2002

Publication series

Name	INTERMAG Europe 2002 - IEEE International Magnetics Conference

Conference

Conference	2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
Country/Territory	Netherlands
City	Amsterdam
Period	28/04/02 → 2/05/02

Bibliographical note

Publisher Copyright:
©2002 IEEE.

Access to Document

10.1109/INTMAG.2002.1001198

Cite this

Lee, Y. W., Lee, T. H., Kim, C. G., Kim, C. O., & Yoon, T. S. (2002). Effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multiplayer. In J. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, J. De Boeck, & R. Wood (Eds.), INTERMAG Europe 2002 - IEEE International Magnetics Conference Article 1001198 (INTERMAG Europe 2002 - IEEE International Magnetics Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INTMAG.2002.1001198

Lee, Young Woo ; Lee, T. H. ; Kim, C. G. et al. / Effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multiplayer. INTERMAG Europe 2002 - IEEE International Magnetics Conference. editor / J. Fidler ; B. Hillebrands ; C. Ross ; D. Weller ; L. Folks ; E. Hill ; M. Vazquez Villalabeitia ; J. A. Bain ; Jo De Boeck ; R. Wood. Institute of Electrical and Electronics Engineers Inc., 2002. (INTERMAG Europe 2002 - IEEE International Magnetics Conference).

@inproceedings{add5e4d6c4b54673b6811ea130599840,

title = "Effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multiplayer",

abstract = "Magnetic tunnel junction (MTJ) composed of ferromagnetic (FM1)/insulator (I)/ ferromagnetic (FM2) layer have investigated for years because it is believed to realize new and high performance magnetic sensor and memory devices. Flat interfaces were required to get best performance without orange peel coupling between FM1 and FM2. This article shows the cross-sectional TEM image of MTJ multilayer. The large curvature of insulator layer is shown at the grain boundary region of FM1. For this purpose, we tried to decrease grain boundary density ς per unit area by increasing grain size of FM1. Then switching field of Mumetal, Hsw1 and exchange coupling field, Hex were measured to see the change of interlayer coupling state.",

author = "Lee, {Young Woo} and Lee, {T. H.} and Kim, {C. G.} and Kim, {C. O.} and Yoon, {T. S.}",

note = "Publisher Copyright: {\textcopyright}2002 IEEE.; 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 ; Conference date: 28-04-2002 Through 02-05-2002",

year = "2002",

doi = "10.1109/INTMAG.2002.1001198",

language = "English",

series = "INTERMAG Europe 2002 - IEEE International Magnetics Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

editor = "J. Fidler and B. Hillebrands and C. Ross and D. Weller and L. Folks and E. Hill and {Vazquez Villalabeitia}, M. and Bain, {J. A.} and {De Boeck}, Jo and R. Wood",

booktitle = "INTERMAG Europe 2002 - IEEE International Magnetics Conference",

}

Lee, YW, Lee, TH, Kim, CG, Kim, CO & Yoon, TS 2002, Effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multiplayer. in J Fidler, B Hillebrands, C Ross, D Weller, L Folks, E Hill, M Vazquez Villalabeitia, JA Bain, J De Boeck & R Wood (eds), INTERMAG Europe 2002 - IEEE International Magnetics Conference., 1001198, INTERMAG Europe 2002 - IEEE International Magnetics Conference, Institute of Electrical and Electronics Engineers Inc., 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002, Amsterdam, Netherlands, 28/04/02. https://doi.org/10.1109/INTMAG.2002.1001198

Effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multiplayer. / Lee, Young Woo; Lee, T. H.; Kim, C. G. et al.
INTERMAG Europe 2002 - IEEE International Magnetics Conference. ed. / J. Fidler; B. Hillebrands; C. Ross; D. Weller; L. Folks; E. Hill; M. Vazquez Villalabeitia; J. A. Bain; Jo De Boeck; R. Wood. Institute of Electrical and Electronics Engineers Inc., 2002. 1001198 (INTERMAG Europe 2002 - IEEE International Magnetics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multiplayer

AU - Lee, Young Woo

AU - Lee, T. H.

AU - Kim, C. G.

AU - Kim, C. O.

AU - Yoon, T. S.

PY - 2002

Y1 - 2002

N2 - Magnetic tunnel junction (MTJ) composed of ferromagnetic (FM1)/insulator (I)/ ferromagnetic (FM2) layer have investigated for years because it is believed to realize new and high performance magnetic sensor and memory devices. Flat interfaces were required to get best performance without orange peel coupling between FM1 and FM2. This article shows the cross-sectional TEM image of MTJ multilayer. The large curvature of insulator layer is shown at the grain boundary region of FM1. For this purpose, we tried to decrease grain boundary density ς per unit area by increasing grain size of FM1. Then switching field of Mumetal, Hsw1 and exchange coupling field, Hex were measured to see the change of interlayer coupling state.

AB - Magnetic tunnel junction (MTJ) composed of ferromagnetic (FM1)/insulator (I)/ ferromagnetic (FM2) layer have investigated for years because it is believed to realize new and high performance magnetic sensor and memory devices. Flat interfaces were required to get best performance without orange peel coupling between FM1 and FM2. This article shows the cross-sectional TEM image of MTJ multilayer. The large curvature of insulator layer is shown at the grain boundary region of FM1. For this purpose, we tried to decrease grain boundary density ς per unit area by increasing grain size of FM1. Then switching field of Mumetal, Hsw1 and exchange coupling field, Hex were measured to see the change of interlayer coupling state.

UR - http://www.scopus.com/inward/record.url?scp=85017215475&partnerID=8YFLogxK

U2 - 10.1109/INTMAG.2002.1001198

DO - 10.1109/INTMAG.2002.1001198

M3 - Conference contribution

AN - SCOPUS:85017215475

T3 - INTERMAG Europe 2002 - IEEE International Magnetics Conference

BT - INTERMAG Europe 2002 - IEEE International Magnetics Conference

A2 - Fidler, J.

A2 - Hillebrands, B.

A2 - Ross, C.

A2 - Weller, D.

A2 - Folks, L.

A2 - Hill, E.

A2 - Vazquez Villalabeitia, M.

A2 - Bain, J. A.

A2 - De Boeck, Jo

A2 - Wood, R.

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002

Y2 - 28 April 2002 through 2 May 2002

ER -

Lee YW, Lee TH, Kim CG, Kim CO, Yoon TS. Effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multiplayer. In Fidler J, Hillebrands B, Ross C, Weller D, Folks L, Hill E, Vazquez Villalabeitia M, Bain JA, De Boeck J, Wood R, editors, INTERMAG Europe 2002 - IEEE International Magnetics Conference. Institute of Electrical and Electronics Engineers Inc. 2002. 1001198. (INTERMAG Europe 2002 - IEEE International Magnetics Conference). doi: 10.1109/INTMAG.2002.1001198

Effect of underlayer microstructure on the exchange coupling of Mumetal/AlOx/Co multiplayer

Abstract

Publication series

Conference

Bibliographical note

Access to Document

Other files and links

Fingerprint

Cite this