Direct measurements of irradiation-induced creep in micropillars of amorphous Cu56Ti38Ag6, Zr52Ni48, Si, and SiO2

  • Sezer Özerinç
  • , Hoe Joon Kim
  • , Robert S. Averback
  • , William P. King

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

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